Kabushiki Kaisha Toshiba

Makiko Okumura

Hiroshi Tanimoto

Tomohisa Kimura

A semiconductor device analyzer has a substrate model reading module, a Y-matrix entry module, a discriminating module, a matrix reduction module, and an output format discriminating module. The substrate model reading module reads a substrate network model of three-dimensional meshes representing the substrate of a semiconductor device. The substrate network model is a network of resistive and capacitive elements and is used for the simulation and analysis of the semiconductor substrate. The Y-matrix entry module prepares a Y-matrix from the substrate network model, each element of the Y-matrix being expressed with a polynomial of differential operator 's'. The discriminating module discriminates internal nodes to be eliminated from external nodes to be left among the nodes of the substrate network model. The matrix reduction module eliminates the internal nodes, thereby reducing the Y-matrix. The output format determining module determines an output format for an operation result.

Semiconductor device analyzer, method for analyzing/manufacturing semiconductor device, and storage medium storing program for analyzing semiconductor device

A noise analyzing apparatus includes an input unit for inputting a structure of an autonomous system, parameter values and analysis conditions, a periodic steady-state solution calculating unit for calculating a periodic steady-state solution of the autonomous system, a noise source adding unit for adding a noise source to a periodic linear time-variant system obtained by linearizing the autonomous system around the periodic steady-state solution, a time-variant transfer function calculating unit for calculating, for each noise source, a time-variant transfer function of the periodic linear time-variant system to which noise sources are added, a reflected component calculating unit for adding power of a time-variant transfer function reflected to a frequency to be observed, and an output unit for outputting as a result of analysis relating to noise based on results of calculations by the above-described calculating units.

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Kanagawa, Japan

Makiko Okumura