Tau-Metrix, Inc.

Illumina Corporation

Majid Aghababazadeh

Gary L Steinbrueck

Nader Pakdaman

James S Vickers

Behnam Javanmardi

Jose J Estabil

Tarun Kumar Khurana

Helmy A Eltoukhy

Poorya Sabounchi

Boyan Boyanov

M Shane Bowen

Sebastian Bohm

Dale Buermann

Hai Quang Tran

Mario M Pelella

Alex Aravanis

Alexander Hsiao

Paul O Ramstad

Abizar Lakdawalla

Jun Kurihara

Nadar Pakdaman

A flow cell including inlet and outlet ports in fluid communication with each other through a flow channel that extends therebetween. The flow channel includes a diffuser region and a field region that is located downstream from the diffuser region. The field region of the flow channel directs fluid along reaction sites where desired reactions occur. The fluid flows through the diffuser region in a first flow direction and through the field region in a second flow direction. The first and second flow directions being substantially perpendicular.

Microdevices and biosensor cartridges for biological or chemical analysis and systems and methods for the same

Systems and methods for conducting designated reactions that include a fluidic network having a sample channel, a reaction chamber, and a reservoir. The sample channel is in flow communication with a sample port. The system also includes a rotary valve that has a flow channel and is configured to rotate between first and second valve positions. The flow channel fluidically couples the reaction chamber and the sample channel when the rotary valve is in the first valve position and fluidically couples the reservoir and the reaction chamber when the rotary valve is in the second valve position. A pump assembly induces a flow of a biological sample toward the reaction chamber when the rotary valve is in the first valve position and induces a flow of a reaction component from the reservoir toward the reaction chamber when the rotary valve is in the second valve position.

Systems and methods including a rotary valve for at least one of sample preparation or sample analysis

Fluidic cartridge including a liquid container having a reservoir configured to hold a liquid. The liquid container includes an interior surface. The fluidic cartridge also includes a transfer tube that extends from the interior surface to a distal end. The distal end includes a fluidic port that is in flow communication with the reservoir through the transfer tube. The transfer tube has a piercing segment that includes the distal end. The fluidic cartridge also includes a movable seal that is engaged to the piercing segment of the transfer tube and configured to slide along the piercing segment from a closed position to a displaced position during a mating operation. The movable seal blocks flow of the liquid through the fluidic port when in the closed position. The piercing segment extends through the movable seal when in the displaced position.

Fluidic cartridges, systems, and methods for conducting biochemical reactions

Flow cells for biological or chemical analysis

Automated system for conducting biochemical reactions

Biosensor cartridge includes a flow cell having inlet and outlet ports and a flow channel that extends therebetween. The flow cell includes a substrate field having a plurality of reaction chambers. The reaction chambers have apertures that open onto the flow channel. The biosensor cartridge also includes an activity detector that is coupled to the flow cell and has an array of pixels that has a fixed position relative to the substrate field of the flow cell. The pixels are assigned to select reaction chambers such that activity detected by the pixels indicates that a desired reaction has occurred within the select reaction chamber. The biosensor cartridge also includes an exterior side surface having a plurality of electrical contacts thereon that are communicatively coupled to the pixels. The electrical contacts of the side surface are configured to engage corresponding mating contacts of a bioassay system.

The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performance parameter is known to be indicative of a particular fabrication process in the fabrication. Evaluation information may then be obtained based on a variance of the value of the performance parameter at the plurality of locations. This may be done without affecting a usability of a chip that is created from the die. The evaluation information may be used to evaluate how one or more processes that include the particular fabrication process that was indicated by the performance parameter value was performed.

Contactless technique for evaluating a fabrication of a wafer

A substrate section that is at least partially fabricated to include contact elements and materials. The substrate section includes doped regions that have a heavily doped N-type region and a heavily doped P-type region adjacent to one another. An exterior surface of the substrate has a topography that includes a light-transparent region in which light, from a light source, is able to reach a surface of the substrate. An application of light onto the light transparent region is sufficient to cause a voltage potential to form across a junction of the heavily doped regions. The substrate section may further comprise one or more electrical contacts, positioned on the substrate section to conduct current, resulting from the voltage potential created with application of light onto the light transparent region, to a circuit on the semiconductor substrate.

Integrated photodiode for semiconductor substrates

The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of test structures located on an active area of a die of the wafer. The specified performance parameter is known to be indicative of a particular fabrication process in the fabrication. Evaluation information may then be obtained based on a variance of the value of the performance parameter at the plurality of locations. This may be done without affecting a usability of a chip that is created from the die. The evaluation information may be used to evaluate how one or more processes that include the particular fabrication process that was indicated by the performance parameter value was performed.

Test structures for evaluating a fabrication of a die or a wafer

System and apparatus for using test structures inside of a chip during the fabrication of the chip

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San Jose, CA, United States of America

Majid Aghababazadeh