Synopsys, Inc.

Mahmoud Shahram

Yansheng Luo

Peivand Fallah-Tehrani

William Chiu-Ting Shu

Jindrich Zejda

Seyed Alireza Kasnavi

Alexander Gyure

Wenyuan Wang

Chi-Chong Lo

Baribrata Biswas

Kishore Singhal

Beifang Qiu

Goetz Leonhardt

Byungwook Kim

Edhi Sutjahjo

Sergey Krasnovsky

Alex Gyure

One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.

Method and apparatus for facilitating variation-aware parasitic extraction

One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.

Method and apparatus for detecting and analyzing the propagation of noise through an integrated circuit

One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.

Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit

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Cupertino, CA, United States of America

Mahmoud Shahram