Other

Mahmoud Behzadirad

Tito Busani

Steven Roy Julien Brueck

Daniel F Feezell

Joshua B Ballard

Daniel Feezell

Ashwin Krishnan Rishinaramangalam

John Neal Randall

David R Hanson

Morteza Monavarian

Saadat Mishkat-Ul-Masabih

Patrick Hudson

John M Randall

Kaitlyn Johanna Hughes Read

Laura Green

Joseph Stinziano

A method for making a device. The method comprises forming a buffer layer on a substrate; forming a periodically doped layer on the buffer layer; forming one or more wires on the periodically doped layer, the wires being chosen from nanowires and microwires; and introducing porosity into the periodically doped layer to form a porous distributed Bragg reflector (DBR). Various devices that can be made by the method are also disclosed.

Devices comprising distributed bragg reflectors and methods of making the devices

Methods and apparatus for electrical impedance spectroscopy for non-destructive, real-time, tracking of relative water content and stress responses in plants.

Electrical impedance spectroscopy for non-destructive, real-time, tracking of relative water content and stress responses in plants

Provided is a composite metal-wide-bandgap semiconductor tip for scanning tunneling microscopy and/or scanning tunneling lithography, a method of forming, and a method for using the composite metal-wide-bandgap semiconductor tip.

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Provided is a composite metal-wide-bandgap semiconductor tip for scanning tunneling microscopy and/or scanning, tunneling lithography, a method of forming, and a method for using the composite metal-wide-bandgap semiconductor tip.

Nanowires that may be utilized in microscopy, for example atomic force microscopy (AFM), as part of an AFM probe, as well as for other uses, are disclosed. The nanowires may be formed from a Group III nitride such as an epitaxial layer that may be or include gallium nitride, indium nitride, aluminum nitride, and an alloy of these materials. During use of the AFM probe to measure a topography of a test sample surface, the nanowire can activated and caused to lase and emit a light, thereby illuminating the surface with the light. In an implementation, the light can be collected by the AFM probe itself, for example through an optical fiber to which the nanowire is attached.

Atomic force microscopy based on nanowire tips for high aspect ratio nanoscale metrology/confocal microscopy

Growing community of inventors

Albuquerque, NM, United States of America

Mahmoud Behzadirad