Intel Corporation

Mahesh J Deshmane

Luke A Johnson

Mark A Beiley

Christopher Wade Ackerman

Johnny Mata Vega

Shoujie He

Jacob Hales

Joseph Zearing

An apparatus includes a processor configured to control an automatic test equipment (ATE) to measure one or more parameters of a current test instance for testing a device under test (DUT), during execution of the current test instance on the DUT, and determine, based on the measured one or more parameters, one or more controls for controlling a temperature of a thermal head connected to the DUT so that a junction temperature of the DUT corresponds to a predetermined test temperature. The processor is further configured to control the temperature of the thermal head, based on the determined one or more controls.

Apparatus and method for controlling unit specific junction temperature with high temporal resolution for concurrent central processing unit (CPU) core testing

According to one embodiment a computer system is disclosed. The computer system includes a bus and a chipset coupled to the bus. The chipset detects the slew rate of a signal transmitted over the bus by the chipset. In addition the chipset adjusts the slew rate based upon the state of the signal.

Slew rate control mechanism

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Chandler, AZ, United States of America

Mahesh J Deshmane