Robert Boschgmbh

Mahesh Goud Tandarpally

Soundararajan Srinivasan

Ruobing Chen

Rumi Ghosh

Marc Naumann

Shan Kang

Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive training data. The electronic processor is also configured to determine a first set of testing parameters from the plurality of testing parameters to remove for the assembly line based on the training data and determine a second set of testing parameters to keep by removing the first set of testing parameters from the plurality of testing parameters. The electronic processor is also configured to determine a predictive model to replace the first set of testing parameters based on the training data associated with the second set of testing parameters, and automatically update a testing process for the assembly line to turn off the first set of testing parameters and use the predictive model in place of the first set of testing parameters.

Test time reduction for manufacturing processes by substituting a test parameter

Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive a dataset associated with an assembly line. The dataset includes a classification for each of the plurality of products produced by the assembly line, where the assembly line is associated with a plurality of tests. The electronic processor is also configured to determine a set of test combinations for the assembly line based on the plurality of tests and, for each test combination, determine a number of missing products based on the classification for each of the plurality of products. The electronic processor is also configured to determine at least one test to remove based on the number of missing products for each test combination and output a result including an indication of the at least one test to remove.

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Los Angeles, CA, United States of America

Mahesh Goud Tandarpally