Foss Analytical A/s

Maersk Supply Services A/s

Mads Lykke Andersen

Thomas Nikolajsen

Per Waaben Hansen

Steen Kjaer Andersen

Bjarne Mølsted

Mogens Velsing

Peter Kragh Jacobsen

Hans Braten

Francois-X Morency

A method of standardizing an output of an electrical property sensor includes calculating a reference magnitude (Cond) of an electrical property of an electrically conductive liquid, based on obtaining, by a spectrometer, spectral data resulting from an interaction of light with the electrically conductive liquid, and applying, in a data processor, a mathematical model to the spectral data to calculate the reference magnitude (Cond) of the electrical property, wherein the mathematical model links the spectral data to magnitudes of the electrical property; comparing, in the data processor, a measured magnitude (Cond) of the electrical property of the electrically conductive liquid with a reference magnitude (Cond) of the electrical property, wherein the measured magnitude (Cond) of the electrical property is obtained with the electrical property sensor; determining, in the data processor, a standardization factor (F) dependent on a ratio of the reference magnitude (Cond) and the measured magnitude (Cond).

Standardizing the output of an electrical property sensor

A spectrometer system comprises a scanning interferometer; a drive system mechanically coupled to a movable reflector element of the scanning interferometer and operable to effect reciprocation of the movable reflector element at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer to generate a sampled interferogram; and a data processor is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.

Spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system

An optical spectrometer may include: an adjustable sampling space having two opposing side-walls between which in use a sample for analysis is charged and in at least one of which is formed an optical interface translucent to optical energy emitted by an optical energy source; an actuator mechanically coupled to one or both of the opposing side-walls and configured to operate in response to a command signal applied thereto to effect relative movement of the opposing side-walls; and/or an optical position sensor configured to detect interference fringes generated by the optical energy traversing a distance between the side-walls a plurality of times, having passed through the at least one optical interface, and configured to generate the command signal in dependence thereof. The adjustable sampling space may be brought into an analysis position at which the side-walls are relatively inclined to form a wedge shape.

Optical spectrometers

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Hilleroed, Denmark

Mads Lykke Andersen