Carl Zeiss Industrielle Messtechnik Gmbh

Optinav Sp. Z O.o.

Maciej Kraszewski

Nils Haverkamp

Andrzej Grzesiak

Mariusz Bodjanski

Arkadiusz Smigielski

Adrian Wójcik

David Jaworski

A specimen of an artificial marker is arranged on an object, the position of which is to be determined. The artificial marker defines a nominal marker pattern with nominal characteristics. The specimen embodies the nominal marker pattern with individual characteristics. One or more images of the specimen are captured while the specimen is arranged on the object. An image representation of the specimen is analyzed using a data set. The data set comprises measured data values representing the individual characteristics as individually measured on the first specimen. Position values representing a 3D position of the specimen relative to a coordinate system are determined. A 3D position of the object is determined based on the position values of the specimen.

Method and system for determining a 3D position of an object in space

A method and a system for determining a 6-DOF-pose of an object in space use an optical-tracking marker attached to the object. The marker comprises an inner marker area having a circular contour with a known radius and a marker pattern defining at least one characteristic marker feature. A camera image of the marker typically shows an elliptical representation of the circular contour and the marker pattern. Based on the image, parameters describing the elliptical representation are determined and the 6-DOF-pose of the marker in space is derived using the parameters.

Method and system for determining a 6-DOF-pose of an object in space

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Slupsk, Poland

Maciej Kraszewski