Matsushita Electric Industrial Co., Ltd.

Machiko Kitayama

Yasuhiro Tai

Masaya Kuwahara

An offset measuring method is for measuring an offset based on an optical beam reflected by an information medium, in a recording and reproduction apparatus including an optical pickup placed on transportation means so as to be driven along a radial direction of the information medium. The method includes the steps of directing an optical beam toward a first measuring position, thereby measuring a first offset amount based on the optical beam reflected at the first measuring position; moving the transportation means by a first distance in a first direction along the radial direction; driving the optical pickup by a second distance, which is equal to the first distance, in a second direction; and directing an optical beam toward a second measuring position, thereby measuring a second offset amount based on the optical beam reflected at the second measuring position.

Growing community of inventors

Nara, Japan

Machiko Kitayama