Oxford Instruments Asylum Research Inc

Somalogic Operating Co., Inc.

Asylum Research Corporation

Tesla Electronics, Inc.

Telsa Electronics, Inc.

Maarten Rutgers

Jason Paul Cleveland

Roger B Proksch

Mario Viani

Jim Hodgson

Jon H Monserud

Jovo Bozidar Majstorovic

Daniel S Smith

Martin Seitzinger

Rachel Woolaver Trahan

James A Hodgson

Matthew Klonowski

Stephan Kraemer

Anil Gannepalli

Barry Vant-Hull

Patrick S Noonan

Daren Walters

Robert T Scribner

Jonathan Hensel

Jake Bloom

Paul Costales

Michael Barich

Robert Walder

William H Hertzog

Keith M Jones

Amir A Moshar

Systems and methods for monitoring orbital shaker health include: monitoring orbital shaker health by monitoring input current relative to stall frequency, monitoring orbital shaker health by monitoring back electromagnetic fields (EMF) supplied to the shaker, monitoring orbital shaker health by analyzing video of rotation shafts included within the shaker during orbit, and monitoring orbital shaker health by analyzing accelerometer data.

Systems and methods for monitoring orbital shaker health

Array plates in accordance with the present teachings may include: a perforated cover plate defining a plurality of first apertures, a supportive base plate defining a planar surface, and a gasket sandwiched between the perforated cover plate and the supportive base plate. Array plates are configured to support a slide, such that the slide is sandwiched between the gasket and the supportive base plate. In some examples, an array plate system in accordance with the present teachings includes a slide ejection tool and/or a gasket installation tool.

Assay array plate

Methods of detecting a leak from a subarray of a microarray chip, kits of components that facilitate leak detection, and microarray chips configured for leak detection are disclosed herein. The methods include positioning, within the given subarray, a sample solution, which includes dissolved sample molecules (DSMs) that define a dissolved sample oligonucleotide sequence and dissolved leak detection molecules (DLDMs) that define a predetermined dissolved leak detection oligonucleotide sequence. The methods also include detecting the DLDMs within a region of the microarray chip that is external the given subarray. The kits of components include the microarray chip and DLDMs. The microarray chips includes a plurality of subarrays and a leak detection region that is at least partially external the plurality of subarrays.

Methods of detecting a leak from a subarray of a microarray chip, kits of components that facilitate leak detection, and microarray chips configured for leak detection

A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Modular atomic force microscope with environmental controls

A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available.

Modular atomic force microscope

An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.

Apparatus and method for scanning capacitance microscopy and spectroscopy

Methods, systems and circuits for analyzing the performance of a vehicle having an electrical system are provided which determine a shift point while the vehicle is being driven. The shift point is determined using acceleration data and RPM data generated from the electrical system.

Automotive performance meter

Growing community of inventors

Los Angeles, CA, United States of America

Maarten Rutgers