Bruker Axs Gmbh

Lutz Bruegemann

Rachel Eisenhower

Arne Kasten

Carsten Michaelsen

Pawel Grybos

Keisuke Saito

Ekkehard Gerndt

Rolf-Dieter Schipper

Eduard Konusch

An X-ray optical configuration for irradiation of a sample () with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source () and a beam-conditioning X-ray optics, is characterized in that the X-ray source () comprises a brilliant point source () and the X-ray optics comprises an X-ray optical element () which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.

Point-line converter

An X-ray reflectometry apparatus comprises an X-ray source () configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector () configured to detect an X-ray beam () reflected from a surface of a selected sample () located in said sample measuring position and with a multiple sample holder () comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism () moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample () directly beneath the measuring position and a sample lift mechanism () has a vertically movable piston () located below the multiple sample holder () beneath the sample measuring position. When the sample lift mechanism () is activated, the piston () moves upwards against a bottom surface of the selected sample () or sample container () containing said selected sample (), lifts the selected sample () or sample container () until it touches a stop () that keeps the sample () in the sample measuring position. When the sample lift mechanism () is deactivated, the piston () moves downwards and the sample () rests in its resting position. The device prevents signal cross talk to neighboring samples or to the sample holder, while also assuring an alignment which can be parallel to the incident beam.

X-ray reflectometry system with multiple sample holder and individual sample lifting mechanism

An X-ray or neutron-optical analysis device comprising means for directing radiation from a source () onto a sample (), and a detector () with n substantially identical detector elements (D) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=, . . . n, for one-dimensional spatially-resolved detection of radiation reflected, scattered or diffracted by the sample () onto the detector (), and with a detection electronics for processing the detector signals of the n detector elements (D), wherein the detection electronics can reliably process a maximum radiation intensity per detector element (D) without overloading, is characterized in that an optical element is disposed in front of the detector () which covers or weakens radiation incident on the surfaces of the respective n detector elements (D) in correspondence with a predetermined, non-constant transmission function f(x) and/or the optical element comprises a collimator () which can be displaced along the strip direction y. The inventive analysis device permits artificial enlargement of the dynamic range of the detector ().

Analysis device with variably illuminated strip detector

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Durmersheim, Germany

Lutz Bruegemann