United Microelectronics Corp.

Lung-Chih Wang

Chun-Ming Chen

Hong-Ze Lin

Shin-Kuang Lin

Shao-Cian Lee

Shan-Yuan Wang

Chung-Ming Huang

Che-Ching Yang

A power MOSFET including a first transistor and a second transistor is provided. The first and the second transistors respectively include following elements. A well region is located in a substrate structure. A trench gate is disposed in the well region. First doped regions are disposed in the well region at two sides of the trench gate. A first metal layer is disposed on a first surface of the substrate structure and electrically connected to the first doped regions. A second doped region is disposed in the substrate structure. A second metal layer is disposed on a second surface of the substrate structure opposite to the first surface and electrically connected to the second doped region. The well regions of the first and the second transistors are separated from each other. The first and the second transistors share the second doped region and the second metal layer.

Power MOSFET

A metal oxide semiconductor device comprising a substrate, at least an isolation structure, a deep N-type well, a P-type well, a gate, a plurality of N-type extension regions, an N-type drain region, an N-type source region and a P-type doped region is provided. The N-type extension regions are disposed in the substrate between the isolation structures and either side of the gate, while the N-type drain region and the N-type source region are respectively disposed in the N-type extension regions at both sides of the gate. The P-type well surrounds the N-type extension regions, and the P-type doped region is disposed in the P-type well of the substrate and is isolated from the N-type source region by the isolation structure.

Metal oxide semiconductor device

Growing community of inventors

Hsinchu County, Taiwan

Lung-Chih Wang