Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Centre National De La Recherche Scientifique

Lukasz Borowik

Jean-Charles Barbe

Denis Mariolle

Ezra Bussmann

Pierre Müller

Fabien Cheynis

Frederic Leroy

Frédéric Leroy

Sylvain Pouch

Nicolas Chevalier

Yann Almadori

Hugo Valloire

A method determines the carrier lifetime in a point of a surface of a sample, and includes in absence of illumination, measuring, at the point, a parameter P via atomic force microscopy technique (AFM) to obtain a value P. The point is illuminated with a continuous light beam and the parameter P is measured, at the point, via AFM to obtain a value P. The point is successively illuminated with continuous modulated light beams each having a different frequency fthat varies between a minimum frequency fand a maximum frequency f, with the modulated light beams having a duty cycle D. For each modulated light beam, the parameter P is measured, at the point, via AFM in such a way as to obtain a value Pfor each frequency f. The carrier lifetime is calculated on point with the values of P, P, the duty cycle D, and f.

Method for determining the carrier lifetime

Method for producing nanocrystals of semiconductor, comprising at least:

Method for producing nanocrystals with controlled dimensions and density

A method for making a semi-conductor nanocrystals, including at least the steps of:

Method for making semi-conductor nanocrystals oriented along a predefined direction

A method for making semi-conductor nanocrystals, including at least the steps of:

Method for making semi-conductor nanocrystals

Growing community of inventors

Sassenage, France

Lukasz Borowik