Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno

Lukas Kramer

Hamed Sadeghian Marnani

Maarten Hubertus Van Es

Anton Adriaan Bijnagte

Jasper Winters

Roelof Willem Herfst

Jan Jacobus Benjamin Biemond

The present disclosure concerns probe cassettefor holding a probein storage to provide automated transfer of the probe to a probe mount of a scanning probe microscope. The probe cassette comprising a first vacuum chamber Cwith a volume V, and a second vacuum chamber Cwith a volume V, and a first and second vacuum channel, respectively fluidly connecting the first and second vacuum chamber to an outletfluidly connectable to an external vacuum, such that upon application of the external vacuum a mounting position of the probe relative to the cassette and a mounting position of the cassette relative to the sample stage is maintained. The probe cassette arranged to allow breaking a vacuum condition in the second chamber maintaining the mounting position of the probe before breaking a vacuum condition in the first chamber maintaining a mounting position of the probe cassette.

Probe cassette for holding a probe in storage for use in a scanning probe microscope

A method of operating a scanning probe microscope, wherein a control loop is provided which is configured for controlling one or more feedback parameters of the scanning probe microscope. One or more system identification measurements are performed during operation of the control loop, wherein during the one or more system identification measurements an excitation signal with a plurality of frequency components is introduced in the control loop and a resulting response signal indicative of a cantilever displacement or a stage-sample distance between a sensor device and a sample is measured. A model response function is identified using said excitation signal and said resulting response signal, wherein one or more settings and/or input signals are adapted in the control loop based on the identified model response function. The scanning probe microscope is used for characterization of the sample using the adapted one or more settings and/or input signals.

Scanning probe microscope and a method for operating thereof

The present document relates to a anatomic force microscope comprising a probe comprising a probe tip configured to sense a sample disposed proximate to the probe tip, a detector to detect a deflection of the probe tip, an actuator coupled to the probe and configured to move the probe in a sense state with the sample at a predetermined force set point and a vibrator in communication with the sample to provide a vibration to the sample, the vibration comprising a modulation frequency, wherein the acoustic vibrator is configured to provide the vibration in a modulation period after an initial sense period without modulation and wherein the probe is moved during or after said modulation period to a successive sample position over said sample while moving the probe in a non-contact state.

Growing community of inventors

Berkel en Rodenrijs, Netherlands

Lukas Kramer