Siemens Healthcare Diagnostics Gmbh

Other

Siemens Aktiengesellschaft

Ludwig Listl

Benjamin S Pollack

Patrick Wissmann

Toshifumi Honda

Yukio Matsuyama

Peter Mengel

Yao-Jen Chang

Ankur Kapoor

Guenter Doemens

Marc Fischer

Venkatesh NarasimhaMurthy

Rayal Raj Prasad Nalam Venkat

Hisae Yamamura

Ramkrishna Jangale

A calibration method is provided including identifying the imaging area on each light panel with respect to each imaging device. A center position of the imaging area of each light panel for each imaging device is determined. An optimal optical center of the imaging apparatus using the center position of the imaging area of each imaging device is determined. A tube calibration tool is installed in a carrier on a track, and the carrier is moved on the track so that a center of the tube calibration tool is located at a closest location to the optimal optical center of the imaging apparatus. The center of the tube calibration tool is used to determine a center of a region of interest (ROI) for backlight calibration. Methods for health checking the calibration and apparatus used to carry out the calibration are provided as well as other aspects.

Methods and apparatus providing calibration of background illumination for sample and/or sample container characterization

A quality check module for characterizing a specimen and/or a specimen container. The quality check module includes an imaging location within the quality check module configured to receive a specimen container containing a specimen, one or more cameras located at one or more viewpoints adjacent to the imaging location, and one or more spectrally-switchable light source including a light panel assembly located adjacent the imaging location and configured to provide lighting for the one or more cameras, the spectrally-switchable light source configured to be operatively switchable between multiple different spectra. Methods of imaging a specimen and/or specimen container and specimen, and specimen testing apparatus including a quality check module adapted to carry out the method are described herein, as are other aspects.

Methods and apparatus for characterizing a specimen container and specimen

A characterization apparatus including pattern generation. The characterization apparatus is configured to characterize a specimen and/or a specimen container in some embodiments. The characterization apparatus includes an imaging location configured to receive a specimen container containing a specimen, one or more image capture devices located at one or more viewpoints adjacent to the imaging location, and one or more light panel assemblies including pattern generation capability located adjacent to the imaging location and configured to provide back lighting. Methods of imaging a specimen and/or specimen container using the pattern generation are described herein, as are other aspects.

Methods and apparatus for characterizing a specimen using pattern illumination

A recording device for distance images becomes multi-target-enabled by means of the arrival of light pulses reflected at object regions at different distances being temporally resolved. This is done using extrema of the gradient of a correlation function between the received light pulses and a time window during which sensor elements of a camera are activated.

Device and method for recording distance-measuring images

A defect judgement processing method and apparatus which can optimize image processing and defect judgement parameters for a detection image cut out by each inspection window to avoid erroneous judgement and defect missing and to realize reliable defect judgement. An image data generator cuts out ranges indicated by a plurality of predesignated inspection windows from a detected image and stores them in a memory, a window data generator generates window data having inspection conditions attached thereto with respect to the plurality of inspection windows and stores them in the memory, a feature extractor reads out detection images of the ranges indicated by the inspection windows from the memory and extracts a structural feature parameter therefrom on the basis of an image processing parameter conforming to the inspection condition obtained by the window data, and a defect judger performs its defect judging operation over the extracted structural feature parameter on the basis of a defect judgement parameter conforming to the inspection condition.

Defect judgement processing method and apparatus

A solder testing apparatus comprising image processing means for performing image processing on an image of an appearance of a soldered portion to identify shape characterizing amounts for the soldered portion; and defect determining means for performing good/bad determination on the soldered portion from data derived by the image processing means and data from test parameter storing means for storing shape characterizing amounts at design time, wherein tested-object standard shape estimating means is included for extracting shape characterizing amounts of a non-defective soldered portion by statistically processing shape characterizing amounts for soldered portions identified by the image processing means, and defect determining parameters stored in the test parameter storing means are updated based on standard shape values from the tested-object standard shape estimating means, so that a highly reliable test is realized by setting defect determining parameters based on actual shapes and dimensions of leads and pads of electronic components on a printed circuit board.

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Munich, Germany

Ludwig Listl