Lsi Logic Corporation

Ludger F Johanterwage

Stefan Graef

Juergen Dirks

Juergen K Lahner

Benjamin Mbouombouo

Weidan Li

Human Boluki

An apparatus comprising one or more groups of boundary scan cells, one or more group buffers, one or more repeater buffers and a controller. The group buffers may be coupled to each of the groups of boundary scan cells. The repeater buffers may be coupled in series with the group buffers. The controller may be coupled to the groups of boundary scan cells through the group buffers and the repeater buffers. The apparatus may be configured to buffer the groups of boundary scan cells to reflect an order of I/Os around the apparatus.

Optimized buffering for JTAG boundary scan nets

According to the present invention, the invention relates to a semiconductor device having an activity monitor circuit formed thereon for monitoring the switching activity of signals generated by other circuits on the device during burn-in testing. In one embodiment, the activity monitor circuit includes means for detecting a present state of a signal; means for comparing the present state with a previous state of the signal; means for determining whether the state of the signal has switched a requisite number of times in a predetermined time period; and means for displaying the results of the determination.

Burn-in activity monitor

Growing community of inventors

Los Gatos, CA, United States of America

Ludger F Johanterwage