Deere & Company

Ludger Aehling

Peter Schade

Systems and apparatus are disclosed to detect constituents using a sensor arrangement. A sensor apparatus for detecting constituents of a material includes a first sensor, which interacts with the material, and is configured to measure an optical spectrum of the material. Further, the first sensor is coupled to an evaluation device that is configured to output an output value relating to the level of the one or more constituents in the material with the aid of the measured spectrum and calibration data. The sensor apparatus further includes a second sensor configured to analyse the material examined by the first sensor and to output a signal relating to the level of the one or more constituents in the material. The sensor apparatus further includes a calibration data generating device configured to generate the calibration data for the evaluation device with the aid of the signal of the second sensor.

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Herxheim am Berg, Germany

Ludger Aehling