Lifescan Scotland Limited

Cilag International Gmbh

Novo Nordisk A/s

Luca Valsecchi

Nick Foley

Allan James Faulkner

Nicholas Foley

Simon Robert Salter

Rochelle Kleinberg

Allan Orr

David Colin Crosland

Ivan Confield

Brian Guthrie

Paul Trickett

Martin Crofton

Jonathan Nelson

Alistair Longmuir

Kim Ejholm Hansen

Adelio Enzo Alfiero Bolognesi

Maurizio Volpe

Roberto Beretta

Rommell Narvaez

Sophie Edgar

Antonio Antonini

Colin Crosland

Gavin Flowers

Jonny Nelson

Flavio Galli

Marco DeAngeli

John Nelson

Michele Sala

Gary Carroll

Niels Pryds Rolsted

Lorenzo Bernardini

Colin Crossland

Paolo Soro

Bennie Pedersen

An electrical connector can receive a substrate having conductive tracks. The connector includes a housing with a port and at least one alignment feature that together define a direction of insertion. At least three function pins mounted to the housing each include contacts that electrically connect to one of the conductive tracks of a substrate inserted in the connector. A sense pin mounted to the housing has a contact that electrically connects to at least one of the conductive tracks of an inserted substrate. The sense pin can include a plurality of electrically-connected segments, each segment extending substantially parallel or substantially perpendicular to the direction of insertion of the substrate. Systems and methods for detecting an analyte in a bodily-fluid sample are also described.

Electrical connector for substrate having conductive tracks

Analyte test meter

A test strip ejection mechanism, for use with a test strip receiving port and a test strip, includes a framework, an elongated shape memory alloy (SMA) strip (e.g., a SMA wire), a slider, and a heating module. The SMA strip has first and second ends that are attached to the framework and exhibits a solid state transition temperature. The slider is configured to travel along the framework. The heating module is configured to heat the SMA strip from a temperature below the solid state transition temperature to a temperature above the solid state transition temperature. Moreover, the SMA strip and slider are configured such that the slider travels along the framework under an applied force exerted on the slider by the SMA strip as the shape memory strip is heated from a temperature below the solid state transition temperature to a temperature above the solid state temperature by the heating module. In addition, the slider has a proximal end configured to engage a test strip received within a test strip receiving port and eject the test strip from the test strip receiving port as the slider travels along the framework. A test meter for use with a test strip includes a test strip receiving port and a test strip ejection mechanism.

Test strip ejection mechanism

Growing community of inventors

Milan, Italy

Luca Valsecchi