Robert Boschgmbh

Huazhong University of Science and Technology

Lubin Han

Yong Kang

Xudan Liu

Maojun He

Lin Liang

An evaluation module configured to evaluate the lifespan of a multichip module, the multichip module comprising a first substrate and multiple chips under evaluation, includes a second substrate, configured to be the same as the first substrate, and having attachment positions corresponding to the attachment positions on the first substrate, and at least one evaluation chip, configured to be the same as the multiple chips under evaluation. The number of evaluation chips is less than the number of chips under evaluation by at least one. The at least one evaluation chip is arranged at an attachment position on the second substrate, such that the at least one evaluation chip and the chip under evaluation arranged at the corresponding attachment position on the multichip module have the same cooling performance and sustain the same thermal stress. The present disclosure also discloses a method for evaluating the lifespan of a multichip module.

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Wuhan, China

Lubin Han