No. 24 Research Institute of China Electronics Technology Group Corporation

China Electronic Technology Corporation, 24th Research Institute

Chongqing Gigachip Technology Co. Ltd.

No. 24 Research Institute of China Electronic Technology Corporation

Lu Liu

Guangbing Chen

Yuxin Wang

Gangyi Hu

Daiguo Xu

Xu Wang

Dongbing Fu

Ruzhang Li

Tao Liu

Minming Deng

Jian'an Wang

Hanfu Shi

Ting Li

Yong Zhang

Yan Wang

Jianan Wang

Jun Luo

Yabo Ni

Liang Li

Xiaofeng Shen

Can Zhu

Shiliu Xu

Zhou Yu

Zicheng Xu

Shengdong Hu

Jiahao Peng

Embodiments of the disclosure provide a circuit, chip, system, and method for eliminating random perturbation. The circuit includes a weight calculating module for receiving digital signals and random perturbation digital quantity, using least mean square error algorithm to calculate weight deviation iteration coefficient based on digital signal and digital quantity, and updating perturbation weight in real-time according to weight deviation iteration coefficient; and a perturbation eliminating module for eliminating perturbation signal in output digital signal of quantizer according to perturbation weight updated in real-time and updating perturbation weight in real-time according to weight deviation iteration coefficient, and then calculating current perturbation weight in real time to realize self-calibration of perturbation weight. Even if the manufacturing process or working environment of the current chip changes, perturbation weight can be dynamically adjusted, to ideally eliminate perturbation signal in digital signal.

Circuits, chips, systems and methods for eliminating random perturbation

A multi-bit resolution sub-pipeline structure for measuring a jump magnitude of a transmission curve, comprising: a sub-analog-to-digital converter having n-bit resolution configured to quantize input analog voltage signals and output digital voltage signals; a sub-digital-to-analog converter having n-bit resolution configured to convert the digital voltage signals output by the sub-analog-to-digital converter into corresponding analog voltage signals; a decoder having n-bit resolution configured to decode an n-bit binary input signal; and a switched-capacitor amplification unit configured to, when in a normal mode, perform sampling and residue amplification on the input analog voltage signals; and when in a test mode, measure the jump magnitude of the transmission curve corresponding to each decision level. Magnitude measurement of a transmission curve is performed within 2clock periods, th and a measurement result is sent to a back-end digital domain of the A/D converter for correction.

Multi-bit resolution sub-pipeline structure for measuring jump magnitude of transmission curve

Provided in the present invention is a transconductance amplifier based on a self-biased cascode structure. The transconductance amplifier includes a self-biased cascode input-stage structure constituted by PMOS (P-channel Metal Oxide Semiconductor) input transistors M, M, Mand M, a self-biased cascode first-stage load structure constituted by NMOS (N-channel Metal Oxide Semiconductor) transistors M, M, Mand M, a second-stage common-source amplifier structure constituted by an NMOS transistor Mand a PMOS transistor M, a bias circuit structure constituted by NMOS transistors Mand Mand a PMOS transistor M, an amplifier compensation capacitor C, an amplifier load capacitor C, a reference current source Iref and a PMOS transistor Mthat provides a constant current source function. Further provided in the present invention is a transconductance amplifier based on a self-biased cascode structure, which adopts an NMOS transistor as an input transistor. Both input transistors and load transistors of a first-stage amplifier of the present invention adopt self-biased cascode structures, such that the output impedance and the DC gain of the first-stage amplifier are increased. Substrate voltages of the MOS transistors of the first-stage amplifier are provided by an amplifier bias circuit. Owing to a connection mode of the compensation capacitor C, a higher figure of merit is achieved.

Transconductance amplifier based on self-biased cascode structure

A high-speed low-power-consumption trigger, which comprises a control signal generation circuit, an enabling unit, and a latch structure. The latch structure comprises two input ends, two output ends, two enabling ends, a second enabling end, and a ground end. The enabling unit comprises two enabling circuits. An output signal X of the control signal generation circuit and an external control signal D serve as input signals of the first enabling circuit. An output end of the first enabling circuit is connected to the first enabling end. The output signal X of the control signal generation circuit and a phase-inverted signal DB of the external control signal D serve as input signals of the second enabling circuit. An output end of the second enabling circuit is connected to the second enabling end.

High-speed low-power-consumption trigger

The present invention provides a frequency-compensated transconductance amplifier, includes an input stage consisting of NMOS transistors Mand M, a first-stage active load consisting of PMOS transistors Mand M, a first-stage tail current source consisting of a constant current source Iss, a second-stage input transistor consisting of a PMOS transistor M, a second-stage constant current source consisting of an NMOS transistor M, a load capacitor consisting of a capacitor C, and a frequency compensation network formed by sequentially connecting a gain stage GAIN, a compensating resistor Rc and a compensating capacitor Cc in series.

Frequency-compensated transconductance amplifier

An analog-to-digital converter of non-binary capacitor array with redundancy bits and its chip. The non-binary capacitor array with redundancy bits comprises a common-mode voltage, analog signal input, no less than one redundancy bit capacitor and multiple capacitors; each capacitor of capacitors with redundancy bits and multiple capacitors is connected in parallel between common-mode voltage and analog signal input and marked in a sequence from highest to lowest/lowest to highest bit; the sum of the capacitance of capacitors from the lowest bit capacitor to an random capacitor must be no less than the capacitance of the higher bit capacitor adjacent to the random capacitor. The ratio of the capacitance of each capacitor to the capacitance of unit capacitor is set to be positive. The capacitor array is applied into an analog-to-digital converter or fabricated as a chip.

Analogue-digital converter of non-binary capacitor array with redundant bit and its chip

A high-speed sampling front-end circuit is presented that includes a MDAC sampling network, a reference voltage generator circuit, a comparator array, an operational amplifier, an output short-circuit switch, an adjustable clock duty cycle stabilizer, a status control module and a feedback control module. The circuit features low power, high sampling rate and high input bandwidth of sampling network. The time constant of the MDAC sampling network and the comparator array is precisely matched one another to improve input bandwidth of the sampling network. Sampling capacitors are designed as feedback capacitors and DAC calculation capacitors, thereby the operational amplifier doubles feedback coefficient and features 50% bandwidth and 50% power. The cycle stabilizer is adopted to shorten sampling time and extend amplification phase to greatly improve sampling rate. One input reference voltage tends to simplify the design of the reference voltage generator circuit. The circuit has wide applications in pipelined A/D converters.

High speed sampling front-end circuit

Growing community of inventors

Chongqing, China

Lu Liu