Growing community of inventors

Beijing, China

Lu Chen

Average Co-Inventor Count = 4.02

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 110

Lu ChenBingxue Shi (9 patents)Lu ChenChun Lu (7 patents)Lu ChenLisheng Gao (6 patents)Lu ChenLin Zhu (6 patents)Lu ChenWen-Zhen Li (6 patents)Lu ChenYuan-Feng Liu (5 patents)Lu ChenZe-Cheng Hou (5 patents)Lu ChenRichard Wallingford (4 patents)Lu ChenMohan Mahadevan (4 patents)Lu ChenTao Luo (4 patents)Lu ChenJason Kirkwood (4 patents)Lu ChenJames A Smith (4 patents)Lu ChenJunqing (Jenny) Huang (4 patents)Lu ChenWei Zhao (2 patents)Lu ChenRobert M Danen (2 patents)Lu ChenCuiwei Tang (2 patents)Lu ChenGrace H Chen (2 patents)Lu ChenRudolf C Brunner (2 patents)Lu ChenYiming Wang (2 patents)Lu ChenZixiang Lin (2 patents)Lu ChenXiaoqiang Yang (2 patents)Lu ChenJian Li (1 patent)Lu ChenChuncheng Che (1 patent)Lu ChenZhifeng Zhang (1 patent)Lu ChenQiang Q Zhang (1 patent)Lu ChenChun Hsien Lu (1 patent)Lu ChenJiaxiang Deng (1 patent)Lu ChenRongbing Tian (1 patent)Lu ChenSainan Li (1 patent)Lu ChenJinrong Liu (1 patent)Lu ChenHongxiang Shu (1 patent)Lu ChenChen Luan (1 patent)Lu ChenLu Chen (25 patents)Bingxue ShiBingxue Shi (36 patents)Chun LuChun Lu (9 patents)Lisheng GaoLisheng Gao (55 patents)Lin ZhuLin Zhu (35 patents)Wen-Zhen LiWen-Zhen Li (29 patents)Yuan-Feng LiuYuan-Feng Liu (7 patents)Ze-Cheng HouZe-Cheng Hou (7 patents)Richard WallingfordRichard Wallingford (36 patents)Mohan MahadevanMohan Mahadevan (21 patents)Tao LuoTao Luo (14 patents)Jason KirkwoodJason Kirkwood (12 patents)James A SmithJames A Smith (11 patents)Junqing (Jenny) HuangJunqing (Jenny) Huang (4 patents)Wei ZhaoWei Zhao (84 patents)Robert M DanenRobert M Danen (25 patents)Cuiwei TangCuiwei Tang (23 patents)Grace H ChenGrace H Chen (17 patents)Rudolf C BrunnerRudolf C Brunner (14 patents)Yiming WangYiming Wang (12 patents)Zixiang LinZixiang Lin (2 patents)Xiaoqiang YangXiaoqiang Yang (2 patents)Jian LiJian Li (152 patents)Chuncheng CheChuncheng Che (91 patents)Zhifeng ZhangZhifeng Zhang (17 patents)Qiang Q ZhangQiang Q Zhang (11 patents)Chun Hsien LuChun Hsien Lu (7 patents)Jiaxiang DengJiaxiang Deng (1 patent)Rongbing TianRongbing Tian (1 patent)Sainan LiSainan Li (1 patent)Jinrong LiuJinrong Liu (1 patent)Hongxiang ShuHongxiang Shu (1 patent)Chen LuanChen Luan (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Winbond Electronics Corporation (9 from 2,029 patents)

2. Kla Tencor Corporation (7 from 1,787 patents)

3. Hon Hai Precision Industry Co., Ltd. (6 from 19,763 patents)

4. Tsinghua University (6 from 4,296 patents)

5. Boe Technology Group Co., Ltd. (2 from 18,140 patents)

6. Beijing Boe Sensor Technology Co., Ltd. (2 from 143 patents)

7. Beijing Beifen-ruili Analytical Instrument (group) Co., Ltd. (1 from 1 patent)

8. Maituowei Precision Instrument Manufacturing Hebei Co., Ltd. (1 from 1 patent)


25 patents:

1. 12294157 - Dual-frequency antenna and electronic device

2. 12166288 - Antenna structure, array antenna and electronic device

3. 11660839 - Three-dimensional hierarchical layered porous copper and method for making the same

4. 11575118 - Current collector and anode electrode of lithium ion battery, and method for fabricating the same

5. 11434889 - Piston seal structure for injector

6. 11312105 - Aluminum matrix composites and method thereof

7. 11225044 - Porous copper composite and method thereof

8. 11196035 - Anode of lithium battery, method for fabricating the same, and lithium battery using the same

9. 10940672 - Aluminum matrix composites and method thereof

10. 10605744 - Systems and methods for detecting defects on a wafer

11. 9880107 - Systems and methods for detecting defects on a wafer

12. 9523646 - Wafer and reticle inspection systems and methods for selecting illumination pupil configurations

13. 9347891 - Wafer and reticle inspection systems and methods for selecting illumination pupil configurations

14. 8605275 - Detecting defects on a wafer

15. 8467047 - Systems and methods for detecting defects on a wafer

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12/3/2025
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