Growing community of inventors

O'Fallon, MO, United States of America

Loyal Bruce Shawgo

Average Co-Inventor Count = 2.36

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 17

Loyal Bruce ShawgoMark David Rogers (4 patents)Loyal Bruce ShawgoJeffery Thomas Murphy (3 patents)Loyal Bruce ShawgoPatrick John Kinlen (2 patents)Loyal Bruce ShawgoEric Alan Bruton (2 patents)Loyal Bruce ShawgoMatthew Alexander Flack (2 patents)Loyal Bruce ShawgoRoger W Engelbart (1 patent)Loyal Bruce ShawgoNathan Rylan Smith (1 patent)Loyal Bruce ShawgoRicky Lance Haney (1 patent)Loyal Bruce ShawgoLoyal Bruce Shawgo (11 patents)Mark David RogersMark David Rogers (8 patents)Jeffery Thomas MurphyJeffery Thomas Murphy (3 patents)Patrick John KinlenPatrick John Kinlen (115 patents)Eric Alan BrutonEric Alan Bruton (22 patents)Matthew Alexander FlackMatthew Alexander Flack (11 patents)Roger W EngelbartRoger W Engelbart (62 patents)Nathan Rylan SmithNathan Rylan Smith (14 patents)Ricky Lance HaneyRicky Lance Haney (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. The Boeing Company (11 from 22,216 patents)


11 patents:

1. 12352675 - Extrudable compositions comprising fillers and devices made from the compositions

2. 11567385 - Electrochromic device

3. 11327013 - Specular variable angle absolute reflectance method and reflectometer

4. 11307476 - Electrochromic device

5. 11022533 - Method of controlling particles size of fillers in extrudable compositions, compositions comprising the fillers and devices made from the compositions

6. 10697893 - Specular variable angle absolute reflectance method and reflectometer

7. 10378962 - Non-contact measurement of multi-temperature profile of an object

8. 10371628 - Apparatus for measuring spectral hemispherical reflectance of samples at grazing angles

9. 10260953 - Applique and method for thermographic inspection

10. 8353626 - Emissivity independent non-contact high temperature measurement system and method

11. 7891866 - Emissivity independent non-contact high temperature measurement system and method

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12/4/2025
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