Science & Technology Corporation &commat; Unm

United States of America As Represented by the Administrator of Nasa

Stc.unm

Idaho Research Foundation, Inc.

Science & Technology Corporation & Unm

Ics LLC

Science & Technology Corporation at Unm

Lowell H Miles

Sterling R Whitaker

Eric G Cameron

Gary K Maki

Jody W Gambles

Jody Gambles

Gregory Donohoe

Self Restoring Logic (SRL) provides for SEU tolerance in high speed circuits. An SRL cell is designed to be stable in one of two internal states. Upon an SEU event, the SRL cell will not transition between the internal stable states and recover from an SEU. SRL circuits are realized with SRL storage cells driving succeeding SRL storage cells directly or through combinational logic such that the corruption of any one internal state variable in the driving SRL cell and it's the associated combinational output logic can affect at most one internal state variable of the succeeding SRL cell. An SRL circuit does not allow propagation of single SEU faults.

Self restoring logic

An application specific integrated circuit is optimized by translating a first representation of its digital design to a second representation. The second representation includes multiple syntactic expressions that admit a representation of a higher-order function of base Boolean values. The syntactic expressions are manipulated to form a third representation of the digital design.

Optimization of digital designs

A diagnosable structured logic array and associated process is provided. A base cell structure is provided comprising a logic unit comprising a plurality of input nodes, a plurality of selection nodes, and an output node, a plurality of switches coupled to the selection nodes, where the switches comprises a plurality of input lines, a selection line and an output line, a memory cell coupled to the output node, and a test address bus and a program control bus coupled to the plurality of input lines and the selection line of the plurality of switches. A state on each of the plurality of input nodes is verifiably loaded and read from the memory cell. A trusted memory block is provided. The associated process is provided for testing and verifying a plurality of truth table inputs of the logic unit.

Diagnosable structured logic array

The encoder chip of the present invention uses LDPC codes to encode input message data at a transmitting end, thereby generating a series of codewords. The encoder chip implements two low-density parity-check (LDPC) codes. The first LDPC code is a (4088,3360) code (4K) which is shortened from a (4095,3367) cyclic code. The second LDPC code is a quasi-cyclic (8158,7136) code (8K). The message data and the generated codewords are transmitted to a receiving end where the received codewords are decoded and checked for errors. To generate the codewords, the encoder applies a generator matrix G to the input message data. The G matrix is generated by first defining an H matrix. An H matrix is initially defined as 16&#xd7;2 array of right-circulant sub-matrices. The G matrix is formed by manipulating the H matrix according to a 4-step algorithm. A randomizer and a synchronization marker are also included within the encoder.

Low-density parity-check (LDPC) encoder

According to the invention, an ASIC cell library for use in creation of custom integrated circuits is disclosed. The ASIC cell library includes some first cells and some second cells. Each of the second cells includes two or more kernel cells. The ASIC cell library is at least 5% comprised of second cells. In various embodiments, the ASIC cell library could be 10% or more, 20% or more, 30% or more, 40% or more, 50% or more, 60% or more, 70% or more, 80% or more, 90% or more, or 95% or more comprised of second cells.

Integrated circuit cell library

A digital integrated circuit chip is designed by identifying a logical structure to be implemented. This logical structure is represented in terms of a logical operations, at least 5% of which include selection operations. A determination is made of logic cells that correspond to an implementation of these logical operations.

Digital design using selection operations

According to the invention, a digital circuit design embodied in at least one of a structural netlist, a behavioral netlist, a hardware description language netlist, a full-custom ASIC, a semi-custom ASIC, an IP core, an integrated circuit, a hybrid of chips, one or more masks, a FPGA, and a circuit card assembly is disclosed. The digital circuit design includes first and second sub-circuits. The first sub-circuits comprise a first percentage of the digital circuit design and the second sub-circuits comprise a second percentage of the digital circuit design. Each of the second sub-circuits is substantially comprised of one or more kernel circuits. The kernel circuits are comprised of selection circuits. The second percentage is at least 5%. In various embodiments, the second percentage could be at least 10%, 20%, 30%, 40%, 50%, 60%, 70%, 80%, 90%, or 95%.

Digital circuits using universal logic gates

According to the invention, a digital design method for manipulating a digital circuit netlist is disclosed. In one step, a first netlist is loaded. The first netlist is comprised of first basic cells that are comprised of first kernel cells. The first netlist is manipulated to create a second netlist. The second netlist is comprised of second basic cells that are comprised of second kernel cells. A percentage of the first and second kernel cells are selection circuits. There is less chip area consumed in the second basic cells than in the first basic cells. The second netlist is stored. In various embodiments, the percentage could be 2% or more, 5% or more, 10% or more, 20% or more, 30% or more, or 40% or more.

Growing community of inventors

Albuquerque, NM, United States of America

Lowell H Miles