Agilent Technologies, Inc.

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Avago Technologies International Sales Pte. Limited

Avago Technologies Wireless IP (singapore) Pte. Ltd.

Avago Technologies Wireless Ip, Pte. Ltd.

Lovell Harold Camnitz

Ray Myron Parkhurst

Roger Lee Jungerman

Bartholomeus Hendrik Jansen

Randall King

David Martin

Chul Hong Park

Sean T Hansen

Kun Wang

Bernhard Ulrich Koelle

Alexia Kekoa

Camille Ann Lesko

Lori Ann Callaghan

Bartholomaus Hendrik Jansen

Keri Liane Williams

In a bulk acoustic resonator device, at least one additional metal feature is formed on a top surface of the bottom electrode at a location at which the bottom electrode electrical contact will subsequently be formed, thereby thickening the metal at the location below where the piezoelectric material layer will be etched to form the opening for the bottom electrode electrical contact. Consequently, even though some of the metal of the additional metal feature and/or of the bottom electrode will be removed during the process of etching the opening in the piezoelectric material layer, the bottom electrode will always retain sufficient thickness after the piezoelectric material layer is etched.

Bulk acoustic resonator devices and processes for fabricating bulk acoustic resonator devices

A method for measuring the forward power output of an amplifier with improved accuracy with a mismatched load based on probing the amplitude of the AC voltage and current in the final amplifier stage. Amplitudes are combined resulting in a composite reading that is affected less by load mismatch. Variations include measuring signal amplitude at two points 90 degrees apart in the transmission medium and measuring the power supply voltage and current of a saturated amplifier.

Power detector for mismatched load

A power amplifier circuit includes an adjustable gain power amplifier for amplifying an RF input signal. An isolated node in the adjustable gain power amplifier is isolated from the output load by a gain stage of the adjustable gain power amplifier. The power level of a signal at the isolated node corresponds to the power level of a signal at the output load. A detector is either capacitively coupled to the isolated node or connected by a direct current (DC) connection. The detector detects the power level of the signal at the isolated node. The detector generates a power level indicator that is sent to a gain control circuit. The gain control circuit adjusts the gain of the adjustable gain power amplifier to maintain a constant drive level at the isolated node.

RF power amplifier with load insensitive indirect forward power detector

A power splitter receives power and has a first and second power output. The first power output is connected first power limiting section. A first matching circuit connects between an output of the first power limiting section and a first phase shifter. A second phase shifter connects between the second power output and a second power limiting section. An output of the second limiting section connects to a second matching circuit. A power combiner receives the output of the first phase shifter and the second matching circuit output. The power from the power combiner is delivered to the load.

Sectional power/voltage/current limiter for a multi-phase amplifier

A sampling apparatus for use in high data rate jitter measurement systems based on offset sampling uses a trigger circuit, along with a time-based variable delay, to align a sampling strobe to drive two samplers. An input data signal is split and fed via separate signal paths into the two samplers. One of the samplers is delayed in sampling the input signal or the input is delayed to one of the samplers, such that the two samples of the input signal are offset in time. The jitter present in the SUT can be calculated using the two samples. In addition, when using two strobe circuits, the jitter inherently present in the strobe circuits can be compensated for by offset sampling a reference clock with each main strobe to determine the phase and cycle number of the reference clock at each strobe time.

Zero-crossing direction and time interval jitter measurement apparatus using offset sampling

Error-related information acquired using a bit error ratio detector (BERT) is extrapolated on the basis of prior testing, in which measurements &ldquo;superior&rdquo; to those acquired by the BERT are used to provide an initial extrapolation calibration. For example, measures of data dependent jitter acquired by a digital communications analyzer (DCA) may be used to offset the less accurate jitter-related measures by the BERT. As a consequence, the benefits of a DCA and a BERT are combined, while using only the BERT.

Jitter measurement extrapolation and calibration for bit error ratio detection

Repetitive sampling of a data signal is performed. A clock reference is generated. The clock reference has a known period relationship with the data signal. The clock reference and the data signal are simultaneously sampled. The sampled information from the clock reference is used to determine in what phase of the clock reference sampled values of the data signal occur.

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Santa Clara, CA, United States of America

Lovell Harold Camnitz