Bell Telephone Laboratories

At&t Bell Laboratories

Columbia University

Louis E Brus

Michael Louis Steigerwald

Peter Michael Rentzepis

Vladimir Edmund Bondybey

Sunmin Ryu

Ronald Rossetti

Irene Dion Payne

Haitao Liu

Abraham Nitzan

Systems and methods are disclosed herein for forming defects on graphitic materials. The methods for forming defects include applying a radiation reactive material on a graphitic material, irradiating the applied radiation reactive material to produce a reactive species, and permitting the reactive species to react with the graphitic material to form defects. Additionally, disclosed are methods for removing defects on graphitic materials.

Systems and methods for forming defects on graphitic materials and curing radiation-damaged graphitic materials

The use of induced electromagnetic field enhancement to improve chemical processing is disclosed. Shape, image and resonant polarizability phenomena are used to obtain regions of increased field intensities where atomic and/or molecular interactions are advantageously affected to yield improved or increased chemical processing.

Chemical processing using electromagnetic field enhancement

Efficient transmission of light through a matrix isolation thin film is obtained despite the fact that the index configuration of the thin film is not appropriate for classical waveguides. The light is transmitted through the film approximately parallel to the substrate, thereby permitting analysis of the thin film, stimulation of reaction within the thin film, or use of the thin film as an optical memory.

Reflective containment of electromagnetic radiation in matrix isolation

Optical fibers in long line communication links fail often in tensile strength. Analysis of tensile properties reveals a variation in tensile strength with fiber length, pointing to uncommon structural defects randomly occurring along the fiber length. Failures occur from crack propagation at these defects. The defects can be revealed according to the invention by nondestructive monitoring during production via off-plane light scattering. A narrow light beam incident across the fiber diameter is refracted in a pattern characteristic of the fiber geometry. Variations in that pattern are produced by structural variations in the fiber or by surface contamination. The nature of the pattern change can indicate the type of defect.

Detecting optical fiber defects

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Madison, NJ, United States of America

Louis E Brus