Saint-gobain Glass France

Saint-gobain Emballage

Lorenzo Canova

Nicolas Nadaud

Andriy Kharchenko

Bernard Nghiem

Arnaud Huignard

Sophie Brossard

Nisita Wanakule

Driss Lamine

Nicolas Mercadier

Bertrand Kuhn

Ramzi Jribi

Sébastien Roy

Jean Philippe Schweitzer

Mathieu Rougnon

The invention relates to a process for obtaining a material comprising a substrate coated on at least one part of at least one of its faces with at least one functional layer, said process comprising:

Method for obtaining a substrate coated with a functional layer by using a sacrificial layer

A process for obtaining an item including a substrate made of glass or glass ceramic coated on at least one portion of at least one of its faces with a stack of thin-layers including no silver layers and including at least one thin layer of a transparent electrically conductive oxide, the process including: a step of depositing the stack, in which step the thin layer of a transparent electrically conductive oxide and at least one thin homogenizing layer are deposited, the thin homogenizing layer being a metal layer or a layer based on a metal nitride other than aluminum nitride, or a layer based on metal carbide; then a heat treatment step in which the stack is exposed to radiation.

Method for producing a substrate coated with a stack including a conductive transparent oxide film

A substrate is coated on one face with a thin-films stack having reflection properties in the infrared and/or in solar radiation including at least one metallic functional layer, based on silver or on a metal alloy containing silver, and at least two antireflection coatings. The coatings each include at least one dielectric layer. The functional layer is positioned between the two antireflection coatings. The stack also includes a terminal layer which is the layer of the stack which is furthest from the face. The terminal layer is a metallic layer consisting of zinc and tin, made of SnZnwith a ratio of 0.1&#x2264;x/y&#x2264;2.4 and having a physical thickness of between 0.5 nm and 5.0 nm excluding these values, or even between 0.6 nm and 2.7 nm excluding these values.

Substrate provided with a stack having thermal properties and a metallic terminal layer

The invention relates to a device for measuring the concentration of a molecule, such as CO, NO or NO, in a gaseous atmosphere at a temperature above 1200&#xb0; C. in a chamber, said molecule having an absorption line at a wavelength between 4 and 8 &#x3bc;m, said device comprising an emitter that emits laser radiation with a wavelength corresponding to that of the absorption line, said emitter emitting the laser radiation through a first window and then through said atmosphere, said window being made of a solid material having, for a material thickness of 1 mm, a transmittance greater than 50% at the wavelength of the laser radiation, the laser radiation being analyzed after having passed through said atmosphere by an analyzer that determines the absorption of the laser radiation by the molecule in the gaseous atmosphere, the window being placed on or in a wall of the chamber, where appropriate via an insert, in order to prevent the hot atmosphere of the chamber escaping therefrom. The invention provides a continuous measurement during normal operation of the installation on which it is mounted. The device according to the invention may equip a glass furnace and continuously measure the concentration of gaseous species in the hot atmosphere during normal operation of the furnace. This allows the burners of the furnace to be adjusted during operation.

Laser gas analyzer

Growing community of inventors

Paris, France

Lorenzo Canova