Analog Devices,inc.

Long Pham

Khiem Quang Nguyen

Howard R Samuels

A state of one or more fuses can be determined using a common-gate FET device to read reference information and test information from a fuse bank. In an example, the FET device can be selectively diode-connected using a first switch that responds to a control signal, and a signal-storing capacitor can be connected to the gate terminal of the FET device. The capacitor can store information about a reference signal when the first switch is closed and a first input signal is applied at a source node of the FET device. When the first switch is open, a second input signal can be applied at the source node of the FET device, and an output signal at the drain node of the FET device can indicate a magnitude relationship between the first input signal and the reference signal. In an example, the second input signal can indicate a state of a fuse.

Common-gate comparator and fuse reader

Improved switching techniques for controlling three-level current steering DAC cells are disclosed. The techniques include decoupling two current sources, implemented as field-effect transistors (FETs), of a DAC cell both from their respective bias sources and from a load for converting a zero digital input, where the decoupling is performed in a certain order. The techniques also include coupling the current sources to their respective bias sources and to the load for converting a non-zero digital input, where the coupling is also performed in a certain order. The certain order of decoupling and coupling the bias sources and the load to the current sources of a DAC cell are based on the phenomenon of current memory in FETs. Utilizing current memory when operating a DAC cell may allow reducing power consumption while preserving the high performance properties of a three-level current steering DAC.

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Long Pham