Apple Inc.

Oracle International Corporation

Long Kong

Utku Seckin

Zuxu Qin

Dawei Huang

Muthukumar Vairavan

Simone Gambini

Ben Chen

Chia-Hsiang Chen

Philip P Kwan

Cristian Marcu

Nachum M Kanovsky

Ranjan Vaish

Chia-hsiang Chen

Shinan Lu

The present disclosure relates to compensating for temperature variation of a mixer. Embodiments herein may include performing a single-point Fast Fourier Transform (FFT) (or complex downconversion with DC average) for a number of samples to obtain a transform for each of the number of samples, phase aligning a set of phases associated with each transform, and averaging each transform to generate an analog-to-digital converter (ADC) power value. Further, the disclosed embodiments may include generating a compensation value based on the analog-to-digital converter power value and applying the compensation value to the calibration circuit of the mixer to compensate for a second-order intermodulation product.

Mixer second-order input-intercept point temperature compensation

A signal transmitter may include a waveform synthesis circuit and a signal transmission circuit. The waveform synthesis circuit may store values of a reference waveform for a selected channel of the signal transmitter, and use the stored values to generate values of reference waveforms for one or more other channels of the signal transmitter. The waveform synthesis circuit may further include a sampling boost circuit to generate one or more additional values for the reference waveforms. The waveform transmission circuit may generate signals for the channels of the signal transmitter based at least in part on the values of the reference waveforms, and transmit the signals via one or more antennas.

Signal transmitters with size-reduced on-chip memory

A computer system may periodically calibrate an oscillator subsystem, which includes a voltage-controlled oscillator circuit configured to generate an oscillator signal using code signal. In response to activation of a calibration mode, an iterative calibration operation may be performed on the voltage-controlled oscillator circuit. In some cases, performing a given iteration of the calibration operation includes determining a value of the code signal using a number of pulses in the oscillator signal sampled during a particular time period, along with previous values of the code signal and a slope of an error function associated with the difference between a desired frequency and a current frequency of the oscillator signal. In other cases, iterations may employ variable sampling times with error handling, in order to decrease the duration of the calibration operation while maintaining a target accuracy.

Voltage-controlled oscillator calibration

An embodiment includes a first feedback tap, a second feedback tap, and a summation circuit. The summation circuit may include a first load and a second load coupled to each other at an internal circuit node, and coupled in series between a power supply node and an output node. The summation circuit may be configured to receive, via a serial communication link, an input signal indicative of a series of data symbols, and to generate an output voltage level on the output node based upon a current data symbol. The first feedback tap, coupled to the output node, may be configured to sink a first current from the output node based upon a first previously received data symbol. The second feedback tap, coupled to an intermediate circuit node, may be configured to sink a second current from the intermediate circuit node based upon a second previously received data symbol.

Decision feedback equalizer with distributed R-C network

Embodiments include systems and methods for on-chip random jitter (RJ) measurement in a clocking circuit (e.g., in a phase-locked loop of a serializer/deserializer circuit). Some embodiments determine a reference delay code sweep window to capture at least a candidate RJ range of a feedback clock signal, the reference delay code sweep window comprising a sequence of reference delay codes. A distribution of one-scores can be computed over the reference delay code sweep window, so that the distribution indicates a relatively likelihood, for each reference delay code, of obtaining a '1' sample when sampling the feedback clock signal according to the delayed clock signal (delayed by an amount according to the reference delay code). The distribution can be transformed into a time domain by computing code offset times for the reference delay codes. A RJ output can be computed as a function of the distribution in the time domain.

On-chip jitter measurement for clock circuits

Growing community of inventors

Campbell, CA, United States of America

Long Kong