Promos Technologies, Inc

Siemans Ag

Mosvel Vitelic Inc.

Liza Chen

Kelly Liao

Jessie Chang

Jiuan Lai

Richard Wei

Cindy Chen

An apparatus for continuity testing of a pogo pin in a probe comprises a substrate having a pad, a power supply providing a voltage difference between the pad and the pogo pin, and a sensing device signaling when the substrate contacts the probe, and a current is generated by the connection of the pogo pin and the pad.

Apparatus and method for continuity testing of pogo pins in a probe

In a semiconductor test equipment, in which test probes are placed into contact with bonding pads of semiconductor chips on a semiconductor wafer, an adjustment tool for adjusting the position of the test probes is disclosed. The adjustment tool comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. The tool is preferably formed of used test probes comprised of tungsten. The tool is plated with a titanium nitride layer to increase the life of the tool.

Tools for positioning semiconductor chip test probes

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Hsinchu, Taiwan

Liza Chen