Intel Corporation

Liqiong Wei

Fatih Hamzaoglu

Cyrille Dray

Blake C Lin

Yih Wang

Kevin X Zhang

Nathaniel August

Pulkit Jain

Vivek K De

James W Tschanz

Yibin Ye

Ananda Roy

Described are apparatuses for improving resistive memory energy efficiency. An apparatus performs data-driven write to make use of asymmetric write switch energy between write0 and write1 operations. The apparatus comprises: a resistive memory cell coupled to a bit line and a select line; a first pass-gate coupled to the bit line; a second pass-gate coupled to the select line; and a multiplexer operable by input data, the multiplexer to provide a control signal to the first and second pass-gates or to write drivers according to logic level of the input data. An apparatus comprises circuit for performing read before write operation which avoids unnecessary writes with an initial low power read operation. An apparatus comprises circuit to perform self-controlled write operation which stops the write operation as soon as bit-cell flips. An apparatus comprises circuit for performing self-controlled read operation which stops read operation as soon as data is detected.

Apparatus for low power write and read operations for resistive memory

Described are apparatuses for improving resistive memory energy efficiency. An apparatus performs data-driven write to make use of asymmetric write switch energy between writeand writeoperations. The apparatus comprises: a resistive memory cell coupled to a bit line and a select line; a first pass-gate coupled to the bit line; a second pass-gate coupled to the select line; and a multiplexer operable by input data, the multiplexer to provide a control signal to the first and second pass-gates or to write drivers according to logic level of the input data. An apparatus comprises circuit for performing read before write operation which avoids unnecessary writes with an initial low power read operation. An apparatus comprises circuit to perform self-controlled write operation which stops the write operation as soon as bit-cell flips. An apparatus comprises circuit for performing self-controlled read operation which stops read operation as soon as data is detected.

Apparatuses for improving resistive memory energy efficiency are provided. An apparatus performs data-driven write to make use of asymmetric write switch energy between write0 and write1 operations. The apparatus comprises: a resistive memory cell coupled to a bit line and a select line; a first pass-gate coupled to the bit line; a second pass-gate coupled to the select line; and a multiplexer operable by input data, the multiplexer to provide a control signal to the first and second pass-gates or to write drivers according to logic level of the input data. An apparatus comprises circuit for performing read before write operation which avoids unnecessary writes with an initial low power read operation. An apparatus comprises circuit to perform self-controlled write operation which stops the write operation as soon as bit-cell flips. An apparatus comprises circuit for performing self-controlled read operation which stops read operation as soon as data is detected.

An apparatus is described that includes a bit line. The apparatus also includes first and second storage cells coupled to the bit line. The first storage cell has a first access transistor. The first access transistor is coupled to a first line resistance. The second storage cell has a second access transistor. The second access transistor is coupled to a second line resistance. The second line resistance is greater than the first line resistance. The apparatus also includes first and second drivers that are coupled to the bit line. The second driver is a stronger driver than the first driver. The apparatus also includes circuitry to select the first driver to write information into the first storage cell and select the second driver to write information into the second storage cell.

Resistive memory write circuitry with bit line drive strength based on storage cell line resistance

Described is a word-line driver which is operable to switch a voltage level of a word-line to one of: first power supply, second power supply, or third power supply wherein the voltage level of the second power supply is higher than the voltage level of the first power supply, and wherein transistors of the word-line driver have same gate oxide thicknesses.

High voltage tolerant word-line driver

Described is an apparatus for improving read and write margins. The apparatus comprises: a sourceline; a first bitline; a column of resistive memory cells, each resistive memory cell of the column coupled at one end to the sourceline and coupled to the first bitline at another end; and a second bitline in parallel to the first bitline, the second bitline to decouple read and write operations on the bitline for the resistive memory cell. Described is also an apparatus which comprises: a sourceline; a bitline; a column of resistive memory cells, each resistive memory cell in the column coupled at one end to the sourceline and coupled to the bitline at another end; and sourceline write drivers coupled to the bitline and the sourceline, wherein the sourceline write drivers are distributed along the column of resistive memory cells.

Low resistance bitline and sourceline apparatus for improving read and write operations of a nonvolatile memory

Described are apparatuses for time domain offset cancellation. One example of the apparatus includes: a variable resistance memory cell; a reference resistive memory cell; a detector to generate an output indicating timing relationship between a pulse arriving from the variable resistance memory cell and a pulse arriving from the reference resistive memory cell; and a logic unit to receive the output from the detector and to generate a control signal to the adjust timing relationship as indicated by the detector.

Apparatus for time domain offset cancellation to improve sensing margin resistive memories

Described are apparatuses and methods for improving resistive memory energy efficiency and reliability. An apparatus may include a resistive memory cell coupled to a conductive line. The apparatus may further include a driver coupled to the conductive line to drive current for the resistive memory cell during a write operation. The resistance of the driver may be selectively increased for two or more time periods during the write operation for detecting a voltage change on the conductive line. The current for the write operation may be turned off when the voltage change is detected to improve resistive memory energy efficiency and reliability.

Apparatuses and methods for detecting write completion for resistive memory

In some embodiments, detecting resistance in a resistive memory cell may be done using a pulse edge. For example, a pulse may be applied through a resistive memory data cell and another through a reference delay circuit to determine which path has the larger delay in order to determine the resistive state of the data cell in question.

Method and apparatus for reading variable resistance memory elements

An approach for power reduction of an integrated circuit device. In response to detecting a change in an activity factor associated with an integrated circuit device from a first activity factor to a second activity factor, a supply voltage and a body bias associated with the integrated circuit device are adjusted based on the second activity factor to reduce power consumption. For one aspect, the supply voltage and body bias are adjusted to maintain a substantially constant operating frequency for the integrated circuit device.

Method and apparatus for reducing power consumption through dynamic control of supply voltage and body bias including maintaining a substantially constant operating frequency

According to one embodiment, an integrated circuit is disclosed. The integrated circuit includes a plurality of circuit blocks. Each circuit block includes a voltage differentiator that generates a local supply for the circuit block.

Dynamic voltage scaling scheme for an on-die voltage differentiator design

Power-down scheme for an on-die voltage differentiator design

A method and apparatus for a four transistor SRAM comprising an array or block of cells. Each cell comprises a pair of pass transistors and a pair of pull-down transistors. In one embodiment of the invention, when the SRAM block is in a standby mode, the difference between the voltage at the gate and the voltage at the source of each pass transistor is greater than 0, and less than the threshold voltage of the pass transistor. In one embodiment of the invention a ground connection of the memory cell is switched such that when the SRAM block is in the standby mode, the ground connection is a virtual ground connection and when the SRAM block is in an active mode the ground connection is a global ground connection.

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Portland, OR, United States of America

Liqiong Wei