University of Washington

Lingpeng Wei

Jonathan T C Liu

Chengbo Yin

Apparatuses, systems, and methods for dynamically shaped focal surface with a scanning microscope. A microscope (e.g., a scanning confocal microscope) may use a scanning element to scan an illumination beam to generate a focal region. The scanning element may include multiple degrees of freedom, such as rotation and translation along orthogonal axes. For example, if the illumination beam is a line focus, rotation along a first axis and translation along a second orthogonal axis may sweep the line focus across a focal surface which is substantially flat and normal to the second axis. In some embodiments, the microscope may be a dual-axis handheld microscope, where a single objective in a handheld housing is used to both direct the scanned illumination beam and receive the collected light.

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Lingpeng Wei