Huazhong University of Science and Technology

Wuhan Joule Yacht Science & Technology Co., Ltd.

Lingjun Zhou

Xiangshui Miao

Hao Tong

Fan Yang

Xingsheng Wang

Yingrui Cai

Chengxu Wang

Yuanbing Wang

Kaizhan Wang

A read and write circuit of a three-dimensional phase-change memory including an operation control circuit and a read and write operation circuit connected to each other. The operation control circuit is configured to load a correct operation pulse onto the read and write operation circuit. A read and write unit in the read and write operation circuit is connected to a memory cell and is configured to load the correct operation pulse onto the memory cell corresponding to the three-dimensional phase-change memory and to mirror the correct operation pulse to a mirror current. A bandgap reference source and a hysteresis comparator are connected to a mirror circuit branch. A feedback chopper circuit loop is connected across the memory cell and the mirror circuit branch and is configured to monitor a current flowing through the memory cell in real time.

Read and write circuit of three-dimensional phase-change memory

The disclosure provides a method for measuring the transverse thermal conductivity of a thin film. The method comprises the steps of measuring the longitudinal thermal conductivity of a thin film to be measured by using a 3&#x3c9; method and by taking a second metal strip deposited on the surface of the thin film to be measured as a heating source at first; measuring the temperature rise of the thin film to be measured in the longitudinal direction by using the 3&#x3c9; method, and deducing the thermal power of the thin film to be measured in the longitudinal direction; and finally, calculating the transverse thermal conductivity of the thin film to be measured. By adopting a 'substrate/thin film to be measured/metal strip' sample structure, the process difficulty of preparing a suspension structure sample can be effectively avoided.

Method and device for measuring transverse thermal conductivity of thin film

Growing community of inventors

Hubei, China

Lingjun Zhou