Growing community of inventors

Lagrangeville, NY, United States of America

Lin Zhou

Average Co-Inventor Count = 2.57

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 291

Lin ZhouShahin Zangooie (10 patents)Lin ZhouEric Peter Solecky (9 patents)Lin ZhouRoger M Young (9 patents)Lin ZhouClemente Bottini (9 patents)Lin ZhouRonald D Fiege (5 patents)Lin ZhouRobert J Foster (5 patents)Lin ZhouStephen W Goodrich (3 patents)Lin ZhouClifford A Pickover (2 patents)Lin ZhouKomminist S Weldemariam (2 patents)Lin ZhouCharles Neill Archie (2 patents)Lin ZhouRobert J Schloss (2 patents)Lin ZhouDmitriy Shneyder (2 patents)Lin ZhouShih Mo (2 patents)Lin ZhouGeorgios A Vakas (2 patents)Lin ZhouErwin E Weissmann (2 patents)Lin ZhouLucas Mingzhi Zhou (2 patents)Lin ZhouEjaj Ahmed (2 patents)Lin ZhouSarah A Kay (2 patents)Lin ZhouXue-Shan Zhang (2 patents)Lin ZhouXue-shan Zhang (2 patents)Lin ZhouOleg Gluschenkov (1 patent)Lin ZhouPing-Chuan Wang (1 patent)Lin ZhouHanyi Ding (1 patent)Lin ZhouSean David Burns (1 patent)Lin ZhouChung-Hsing Chang (1 patent)Lin ZhouChristopher Thomas Li (1 patent)Lin ZhouJoseph J Mezzapelle (1 patent)Lin ZhouTed Hsiung (1 patent)Lin ZhouYork Zhiyuan Zhou (1 patent)Lin ZhouJunjie Yang (1 patent)Lin ZhouShahin Zangodie (1 patent)Lin ZhouCheng Shan Yin (1 patent)Lin ZhouLin Zhou (37 patents)Shahin ZangooieShahin Zangooie (12 patents)Eric Peter SoleckyEric Peter Solecky (30 patents)Roger M YoungRoger M Young (14 patents)Clemente BottiniClemente Bottini (9 patents)Ronald D FiegeRonald D Fiege (6 patents)Robert J FosterRobert J Foster (5 patents)Stephen W GoodrichStephen W Goodrich (3 patents)Clifford A PickoverClifford A Pickover (837 patents)Komminist S WeldemariamKomminist S Weldemariam (145 patents)Charles Neill ArchieCharles Neill Archie (25 patents)Robert J SchlossRobert J Schloss (17 patents)Dmitriy ShneyderDmitriy Shneyder (12 patents)Shih MoShih Mo (9 patents)Georgios A VakasGeorgios A Vakas (3 patents)Erwin E WeissmannErwin E Weissmann (3 patents)Lucas Mingzhi ZhouLucas Mingzhi Zhou (2 patents)Ejaj AhmedEjaj Ahmed (2 patents)Sarah A KaySarah A Kay (2 patents)Xue-Shan ZhangXue-Shan Zhang (2 patents)Xue-shan ZhangXue-shan Zhang (2 patents)Oleg GluschenkovOleg Gluschenkov (257 patents)Ping-Chuan WangPing-Chuan Wang (177 patents)Hanyi DingHanyi Ding (112 patents)Sean David BurnsSean David Burns (72 patents)Chung-Hsing ChangChung-Hsing Chang (12 patents)Christopher Thomas LiChristopher Thomas Li (10 patents)Joseph J MezzapelleJoseph J Mezzapelle (5 patents)Ted HsiungTed Hsiung (2 patents)York Zhiyuan ZhouYork Zhiyuan Zhou (1 patent)Junjie YangJunjie Yang (1 patent)Shahin ZangodieShahin Zangodie (1 patent)Cheng Shan YinCheng Shan Yin (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (26 from 164,108 patents)

2. Other (6 from 832,680 patents)

3. Huwomobility, Inc. (2 from 3 patents)

4. Micron Technology Incorporated (1 from 37,905 patents)

5. Globalfoundries Inc. (1 from 5,671 patents)


37 patents:

1. 12422730 - Electromagnetic wave and energy storage

2. 11190150 - CMOS triple-band RF VGA and power amplifier in linear transmitter

3. 10915819 - Automatic real-time identification and presentation of analogies to clarify a concept

4. 10826450 - Hybrid concurrent and switched dual-band low noise amplifier

5. 10780271 - System and method for perceiving smell remotely

6. 9756552 - Reducing distractions caused by user devices in group settings

7. 9349661 - Wafer thinning endpoint detection for TSV technology

8. 8736275 - Alignment correction system and method of use

9. 8680871 - Alignment correction system and method of use

10. 8451008 - Alignment correction system and method of use

11. 8411270 - Monitoring stage alignment and related stage and calibration target

12. 8080849 - Characterizing films using optical filter pseudo substrate

13. 7831395 - Quantification of adsorbed molecular contaminant using thin film measurement

14. 7808657 - Wafer and stage alignment using photonic devices

15. 7742160 - Determining angle of incidence with respect to workpiece

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