Eastman-kodak Company

Lillian M Kellogg

Joe E Maskasky

James Henry Reynolds

George J Burgmaier

Steven P Szatynski

Dale E Hamilton

Stephen P Singer

Janet N Younathan

Joseph M Hodes

A method of electronic processing of an imagewise exposed dispersed particle photoconductive material imaging element employing pulsed radiation and radio frequency photoconductivity apparatus having a sample capacitor with a gap is described, comprising the steps of: a) placing the imagewise exposed photoconductive material imaging element in an electromagnetic field adjacent the sample capacitor; b) scanning the element through the gap in the sample capacitor with a pulsed, focused beam of radiation; c) directly measuring the photoelectron response of the element and recording the resulting signals from the radio frequency photoconductivity apparatus; and d) advancing the element past the capacitor and repeating steps b) and c); wherein the photoconductive material imaging element comprises photoconductive particles which contain deep electron trapping agents which in an unfilled state effectively decrease the photoconductivity of the photoconductor particles, and wherein imagewise exposure of the photoconductive particles of the imaging element fill deep electron traps and increase the photoconductivity of exposed particles relative to unexposed particles, such that increased imagewise exposure in the photoconductive material results in an increased photoconductivity signal in step c).

Method of electronic processing of imagewise exposed photoconductive material imaging element

A photoconductive material imaging element is described comprising a support and a silver halide emulsion imaging layer comprising silver halide grains which have not been chemically sensitized to optimize formation of latent image Ag , centers upon imagewise exposure and which are doped with at least 500 deep electron trapping agent dopant centers per grain. In accordance with a preferred embodiment, the photoconductive material imaging element includes a planar support and the non-chemically sensitized, deep electron trapping agent doped silver halide grains comprise tabular grains, preferably with an average grain size equivalent circular diameter of greater than 2 &mgr;m, with the long dimensions of the tabular grains primarily oriented parallel to the plane of the support.

Photoconductive material imaging element

A method of electronic processing of a latent image from a photographic element, the method employing pulsed radiation and radio frequency photoconductivity apparatus having a sample capacitor with a gap, including the steps of: placing the element in an electromagnetic field adjacent the sample capacitor; providing an advance mechanism for advancing the photographic element past the capacitor; scanning the element through the gap in the sample capacitor with a pulsed, focused beam of radiation; directly measuring the photoelectron response of the element and recording the resulting signals from the radio frequency photoconductivity apparatus; and advancing the element and repeating the exposing and measuring steps to provide a two dimensional readout of the latent image on the photographic element at ambient temperature or below.

Method of electronic processing of exposed photographic material

Silver halide element with improved high temperature storage

Silver halide element with improved high temperature storage and raw stock keeping

A method is described for electronically processing exposed photographic materials for detection and measurement of latent images contained therein.

Growing community of inventors

Webster, NY, United States of America

Lillian M Kellogg