Other

Chinese Academy of Sciences

Beijing Const Instruments Technology Inc.

Beijing Keyton Electronic Relay Corporation Ltd.

Lijun Dong

Genglin Wang

Ningbo Li

Chao Zhao

Fei Fei Li

Liyan Wang

Shichun Zhao

Baoqi Liu

Yongmin Liu

Caiyi Wang

An instrument calibration apparatus and a calibration method using same. The apparatus comprises a physical quantity input/output unit, a physical quantity measurement unit, a physical quantity configuration unit, a display unit, a man-machine interaction unit, a storage unit, and a control unit. The apparatus can be widely applied to automatic calibration of multivariable instruments.

Instrument calibration device and calibration method using same

The present invention discloses an improved method of combination test by using argon as gross-leak tracer gas and using helium as fine-leak tracer gas, belongs to the field of hermeticity test. The method is designed to solve the problem that the existing methods are not ideal when the component has lower &#x3c4;and wider range of volume V. The invention comprises step S1 of selecting: using helium-argon prefilling method for the first hermeticity test and helium-argon pressuring method after helium-argon prefilling for repetitive hermeticity test, or using helium-argon pressuring method after argon prefilling for the first hermeticity test and helium-argon multi-pressuring method after argon prefilling for repetitive hermeticity tests. The improved method extends the maximum detection-waiting time, effectively prevents detection missing and misjudges in gross-leak/fine-leak test, and solves the detection problems on applicability, feasibility and credibility.

Combination test method by using argon as gross-leak test tracer gas and using helium as fine-leak test tracer gas

A method for helium mass spectrometric fine-leak test is based on quantitative determination of maximum test-waiting time, which gives a method for quantitative determination of the maximum test-waiting time for fine-leak test during a helium mass spectrometric test process of the sealability, and gives a method for determining the criterion for measured leak rate by taking the minimum helium gas exchange time constant, i.e., a rigour grade &#x3c4;, of an acceptable sealed electronic component as a basic criterion for helium mass spectrometric fine-leak test. Based on the inventive method for quantitative determination of the maximum test-waiting time, for most of the cavity volume ranges, the maximum test-waiting time that is determined accurately may be much longer than 1 hour or 0.5 hour as determined qualitatively by the existing related standards.

Method for helium mass spectrometric fine-leak test based on quantitative determination of maximum test-waiting time

A solid hole array and a method for forming the same are disclosed. The solid hold array may comprise: substrate with a via; a top hole array base formed on a top surface of the substrate and a bottom hole array base formed on a bottom surface of the substrate, wherein a front hole is located in the top hole array base at a place corresponding to the via; and top protection layer formed on a surface and sidewalls of the top hole array base and a bottom protection layer formed on a surface of the bottom hole array base, wherein a rear window is located in the bottom hole array base and the bottom protection layer at a place corresponding to the via.

Solid hole array and method for forming the same

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Beijing, China

Lijun Dong