Metris N.v.

3d Scanners Limited

Metris Ipr N.v.

Lieven De Jonge

Bart Van Coppenolle

Frank Thys

Kris Vallons

Denis Vanderstraeten

The present invention relates to a method for evaluating an object by reading and commands of a macro normally used in measurement equipment for evaluating a physical object, and applying said commands to a numerical (virtual) representation of a physical object. Said method provides a evaluation of the physical object, by applying said macro to a virtual representation of said object.

Method, device and computer program for evaluating an object using a virtual representation of said object

An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.

Optical probe for scanning the features of an object and methods thereof

The present invention relates to an improved method for the simultaneous calibration and qualification of a non-contact probe on a localizer using a single artifact, in which non-contact probe readings and localizer readings are synchronised using parameters determined simultaneously with calibration and qualification. The invention also relates to a non-contact probe and other devices, and a computer program for performing the invention.

Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe

Optical probe for scanning the features of an object and methods therefor

The present invention relates to a method for calibrating a non-contact probe on a localizer. The present invention further relates to a method for the simultaneous calibration and qualification of a non-contact probe on a localizer. Both methods do not require user intervention, and use a single artifact.

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Overijse, Belgium

Lieven De Jonge