Inventec Corp.

Inventec (Pudong) Technology Corporation

Lien-Feng Chen

Chun-Hao Chu

Hsueh-Chih Lu

The present disclosure relates to a method for testing connectivity. The method is applied to an electronic equipment which is disposed include two test units (e.g. network interface controller, RJ-45 connector) and a network transformer. The test unit couple to the network transformer so that can send a high frequency test signal or a low frequency test signal to the network transformer respectively. When the test unit receives a low frequency response signal, it means correspond internal circuitry of the network transformer does not have a open circuit fault. When the test unit does not receive a high frequency response signal, it means correspond pins of the network transformer does not have a short circuit fault.

Method for testing connectivity

The present disclosure provides a testing apparatus for executing a test program, to perform a first test on a circuit component on a circuit board and a second test on the circuit board. The testing apparatus includes a first module, a second module, and a signal transmission line that connects the two. The first module includes a control unit, a signal generation unit, a signal processing unit, a signal expansion unit, and a power supply unit. The control unit generates a first control signal or a second control signal. The signal generation unit generates a current signal or a voltage signal. The signal processing unit generates a numerical signal. The signal expansion unit generates a second data signal. The power supply unit generates a working voltage. The second module includes a test address assignment unit that assigns an address and a signal isolation unit that performs noise immunization process.

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Taipei, Taiwan

Lien-Feng Chen