Taiwan Semiconductor Manufacturing Comp. Ltd.

Lie-Szu Juang

Chung-Hsing Wang

Yi-Kuang Lee

Lee-Chung Lu

Chin-Chou Liu

Yung-Chin Hou

Cliff Hou

Chin-chou Liu

Hung-Yi Liu

The present disclosure provides a method and a system for determining the equivalence of the DRM data set and the DRC data set. The system retrieves a DRM data set and a DRC data set, and transforms the DRM data set and the DRC data set into a first data structure node and a second data structure node respectively. The system determines whether the first data structure node and the second data structure node are equivalent according to a data structure node comparison model.

Method and system for determining equivalence of design rule manual data and design rule checking data

Disclosed is a system, method, and computer-readable medium for designing a circuit and/or IC chip to be provided using an optical shrink technology node. Initial design data may be provided in a first technology node and through the use of embedding scaling factors in one or more EDA tools of the design flow, a design (e.g., mask data) can be generated for the circuit in an optical shrink technology node. Examples of EDA tools in which embedded scaling factors may be provided are simulation models and extraction tools including LPE decks and RC extraction technology files.

Integrated circuit design in optical shrink technology node

A method of designing integrated circuits includes providing a design of an integrated circuit at a first scale, wherein the integrated circuit includes a shrinkable circuit including a first intellectual property (IP); and a non-shrinkable circuit including a second IP having a hierarchical structure. A marker layer is formed to cover the non-shrinkable circuit, wherein the shrinkable circuit is not covered by the marker layer. The electrical performance of the non-shrinkable circuit is simulated using a simulation tool, wherein the simulated non-shrinkable circuit is at a second scale smaller than the first scale.

Method for non-shrinkable IP integration

A method for processing an integrated circuit is provided. The method includes providing a first integrated circuit having a first scale, wherein the first integrated circuit comprises a shrinkable circuit comprising a first intellectual property (IP) layout, and a non-shrinkable circuit comprising a second IP layout; and generating a second integrated circuit having a second scale smaller than the first scale. The step of generating the second integrated circuit includes shrinking the shrinkable integrated circuit to the second scale. The method further includes merging the second IP layout with the non-shrinkable circuit to generate a final integrated circuit.

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Saratoga, CA, United States of America

Lie-Szu Juang