Shanghai Tianma Micro-Electronics Co., Ltd.

Iray Technology Company Limited

Libo Jin

Zhongshou Huang

Jun Xia

Huan Yue

Wenwen Xiao

Chongyu Zhu

A thin-film transistor (TFT) panel and a test method are disclosed. The TFT panel includes: m×n bonding pads, where m and n are both natural numbers greater than or equal to 1, and the m×n bonding pads are arranged correspondingly to and electrically connected to TFT units in a TFT active area; a TFT test area including m drive pads, n test pads, and m×n TFT devices, where the m×n TFT devices are divided into n groups, each of which includes m TFT devices. the m TFT devices in each group corresponding to and are electrically connected to the m drive pads and m bonding pads respectively, and the m TFT devices in each group are electrically connected to a same test pad of the n test pads. The m×n bonding pads that were originally bonded by pressure once are tested in m sessions.

TFT panel and test method

An ESD protection system includes an ESD leakage bus and an ESD protection circuit having one of its terminals connected to the ESD leakage bus. The ESD protection circuit includes at least a pair of amorphous silicon thin film transistors which are connected in a back-to-back manner, and a first shading layer is provided over the channels of the pair of amorphous silicon thin film transistors. When the ESD protection system is applied to an X-ray flat panel detector, no photocurrent will occur during the use of the X-ray flat panel detector, the effect of the photocurrent on the voltage of the scan line is reduced. Further, when the first shading layer is connected to a negative fixed potential, it can be ensured that the ESD protection circuit has small threshold voltage while the leakage current in the ESD protection circuit is reduced, and power consumption is reduced.

ESD protection system and X-ray flat panel detector

Growing community of inventors

Shanghai, China

Libo Jin