Average Co-Inventor Count = 2.31
ph-index = 10
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Changxin Memory Technologies, Inc. (31 from 1,635 patents)
2. Huawei Technologies Co., Limited (22 from 27,108 patents)
3. Integrated Device Technology, Inc. (9 from 1,264 patents)
4. Guangdong Oppo Mobile Telecommunications Corp., Ltd. (8 from 4,374 patents)
5. Dow Global Technolgoies LLC (5 from 4,629 patents)
6. Micron Technology Incorporated (2 from 37,905 patents)
7. Hefei University of Technology (2 from 146 patents)
8. Hon Hai Precision Industry Co., Ltd. (1 from 19,763 patents)
9. Ford Motor Company Limited (1 from 6,151 patents)
10. University of Chicago (1 from 915 patents)
11. Inventec Appliances Corporation (1 from 293 patents)
12. Ambit Microsystems (shanghai) Ltd. (1 from 166 patents)
13. Montage Technology Co., Ltd. (1 from 45 patents)
14. University of Shanghai for Science and Technology (1 from 44 patents)
15. Siemens Aktiengesellschaft (30,028 patents)
126 patents:
1. 12314629 - Wireless audio system and method for wirelessly communicating audio information
2. 12222823 - User data backup to data partition of storage medium
3. 12204116 - Method for fabricating fly-eye lens
4. D1046044 - Billiard ball
5. 12107766 - Network congestion handling method, model update method, and related apparatus
6. 12101238 - Data transmission performance detection
7. 12100444 - Memory
8. 12033709 - Test circuit and test method thereof
9. 12026073 - Method and system for repairing memory device
10. 12028393 - Wireless multimedia apparatus and operation method thereof
11. 12012521 - Polymer mixture, multilayer article containing the same, and process of preparing the multilayer article
12. 11972828 - Repair circuit, memory, and repair method
13. 11955991 - Apparatuses and methods for pipelining memory operations with error correction coding
14. 11948650 - Testing circuit, testing device and testing method thereof
15. 11928067 - Read operation circuit, semiconductor memory, and read operation method