No. 24 Research Institute of China Electronics Technology Group Corporation

Chongqing Gigachip Technology Co. Ltd.

China Electronics Technology Group Corporation No. 24 Research Institute

China Electronic Technology Corporation, 24th Research Institute

Liang Li

Dongbing Fu

Guangbing Chen

Xiaofeng Shen

Xi Chen

Mingyuan Xu

Xingfa Huang

Ting Li

Jianan Wang

Jian'an Wang

Ruzhang Li

Yong Zhang

Daiguo Xu

Yabo Ni

Yuxin Wang

Gangyi Hu

Yan Wang

Jie Pu

Youhua Wang

Huaiqiang Yu

Chao Chen

Hequan Jiang

Zhengping Zhang

Lei Zhang

Gang-Yi Hu

Can Zhu

Lu Liu

Rong-Ke Ye

Jun Liu

Xing-Fa Huang

Xiao-Feng Shen

Ming-Yuan Xu

You-Hua Wang

Xu Huang

Hongrui Yang

Jiao-Xue Li

Jiahao Peng

Shuiqin Yao

Xianjie Wan

Tiehu Li

Xue-Liang Xu

A method for correcting an analog-to-digital converter includes the following steps: extracting gain errors and weight errors of all conversion stages of an analog-to-digital converter; performing first correction on the analog-to-digital converter based on the gain errors and the weight errors; extracting jitter errors of all conversion stages of the analog-to-digital converter after the first correction; and performing a second correction on the analog-to-digital converter based on the jitter errors. According to the disclosure, the gain errors, the weight errors, and the jitter errors of all conversion stages are successively extracted, and then the analog-to-digital converter is corrected. Precision after the corrections is higher. An actual weight of each quantization unit at each conversion stage, an actual inter-stage gain of each conversion stage and an actual weight of jitter are extracted, impact of a jitter weight is eliminated during outputting, and a signal-to-noise ratio of analog-to-digital conversion is increased.

Method for correcting analog-to-digital converter

A method for calibrating an analog-to-digital converter includes the following steps: conducting an initial performance test and judgement on the analog-to-digital converter; if the initial performance test succeeds, performing a pre-trimming and judgement on the analog-to-digital converter; if the pre-trimming succeeds, performing an error extraction on the analog-to-digital converter, obtaining errors of conversion stages of the analog-to-digital converter; performing an error soft trimming and test on the analog-to-digital converter according to the errors of the conversion stages; and if the error soft trimming and test of the analog-to-digital converter succeed, performing an error hard trimming and test on the analog-to-digital converter according to the errors of the conversion stages.

Method for calibrating analog-to-digital converter

Embodiments of the disclosure provide a circuit, chip, system, and method for eliminating random perturbation. The circuit includes a weight calculating module for receiving digital signals and random perturbation digital quantity, using least mean square error algorithm to calculate weight deviation iteration coefficient based on digital signal and digital quantity, and updating perturbation weight in real-time according to weight deviation iteration coefficient; and a perturbation eliminating module for eliminating perturbation signal in output digital signal of quantizer according to perturbation weight updated in real-time and updating perturbation weight in real-time according to weight deviation iteration coefficient, and then calculating current perturbation weight in real time to realize self-calibration of perturbation weight. Even if the manufacturing process or working environment of the current chip changes, perturbation weight can be dynamically adjusted, to ideally eliminate perturbation signal in digital signal.

Circuits, chips, systems and methods for eliminating random perturbation

SAR ADC and sampling method based on single-channel TIS. The SAR ADC comprises: a capacitor array comprising a weight capacitor and a compensation capacitor, a first switch array, a second switch array, a channel switch group and a sampling switch; when in a sampling state: a lower plate of the weight capacitor is connected to an input voltage by means of the first switch array, and an upper plate of the capacitor array is connected to a common mode voltage by the sampling switch and the channel switch group; when in a successive approximation state: the lower plate of the weight capacitor is connected to a reference voltage by the second switch array. Input signals are sampled by using a unified to sampling switch, which solves the problem in the traditional technology that sampling moments are mismatched due to different sampling signals in each time-interleaved channel.

SAR ADC and sampling method based on single-channel time-interleaved-sampling

A clock driver circuit, including: an input stage, a double-ended to single-ended conversion stage and a driver output stage connected in sequence. The input stage includes two mutually loaded differential amplifiers and a common mode negative feedback loop. The differential amplifiers are connected to a differential clock signal for amplification to generate a common mode voltage. The common mode feedback circuit is connected to an output end of the differential amplifiers to stabilize the output amplitude of the common mode voltage. The double-ended to single-ended conversion stage converts a differential sine clock signal output by the double-ended common mode voltage into a single-ended square wave clock signal. The driver output stage includes a multi-stage cascaded push-pull phase inverter to improve the drive capability of the square wave clock signal.

Clock drive circuit

The present disclosure provides a one-time programmable capacitive fuse bit, including an upper plate, the upper plate includes a plurality of fuses arranged side by side and spaced by an internal from each other, middle portions of two adjacent fuses are connected to each other; a connecting portion connected to the fuse is disposed above two ends and the middle portion of each of the plurality of fuses; the fuse bit further includes a lower plate corresponding to the two ends and the middle portion of the fuse, the lower plate is disposed below the fuse; the lower plate corresponding to the middle portion of the fuse is opposite to the connecting portion corresponding to the middle portion of the fuse; a hollow portion is disposed between the lower plate corresponding to the middle portion of the fuse and the lower plate corresponding to both ends of the fuse.

One-time programmable capacitive fuse bit and a memory

The present disclosure provides a differential clock cross point detection circuit and a detection method. The detection circuit includes: a first MOS transistor (M), a second MOS transistor (M) and a capacitor (C); a drain of the first MOS transistor (M) is connected to a negative terminal (CLK&#x2212;) of a differential clock, a gate of the first MOS transistor (M) is connected to a positive terminal (CLK+) of the differential clock, and a source of the first MOS transistor (M) is connected to a drain of the second MOS transistor (M); a gate of the second MOS transistor (M) is connected to the negative terminal (CLK&#x2212;) of the differential clock, and a source of the second MOS transistor (M) is connected to an output terminal through a node; one terminal of the capacitor (C) is connected to a node (A), and the other terminal of the capacitor (C) is grounded.

Differential clock cross point detection circuit and detection method

The present disclosure provides a circuit for generating a multi-phase clock having random disturbance added thereto. The circuit for generating a clock includes a main clock module, a random signal generation module and a buffer matrix switch module. The main clock module generates N multi-phase clock signals; and the buffer matrix switch module randomly switches, under the control of a random control signal output by the random signal generation module, transmission paths of the input N multi-phase clock signals, and outputs N multi-phase clock signals with random disturbance. In the present disclosure, the clock phase error is whitened by adding random disturbance. Only with a small loss of signal-to-noise ratio, the influence of a multi-phase clock phase error on the performance of a high-precision TI ADC can be eliminated in real time, and the influence of the fluctuation of a clock phase error can be tracked and eliminated.

Circuit for generating multi-phase clock having random disturbance added thereto

The present disclosure provides a high-speed regenerative comparator circuit, including: a signal input stage connected with an input terminal for differential signal input; a latch for caching and serving as a differential signal output terminal; a current source connected with the signal input stage for providing a power supply voltage; a fast path connected with the output terminal and used for increasing a voltage difference of the output terminal and turning on a positive feedback network of the latch; and a reset switch, including a first reset switch and a second reset switch. In the high-speed regenerative comparator circuit of the present disclosure, the transmission delay of the regenerative comparator circuit can be greatly reduced; and in a latch phase, a bias voltage is disconnected by means of timing control, and thus the power consumption of a comparator can be reduced. The present disclosure has simple circuit and high reliability.

High-speed regenerative comparator circuit

A duty cycle adjustment apparatus comprises a first edge extraction unit for extracting a rising edge of a first clock signal; a locking discrimination unit configured to output a control signal according to a comparison result between a discrimination voltage and a stabilized voltage, and select to connect the first clock signal or the clock output signal; an integration unit, configured to convert the feedback signal into the stabilized voltage, amplify the stabilized voltage to reach a reference voltage, and output a control voltage; a charge pump, configured to output a second clock signal according to the control voltage; a second edge extraction unit, configured to extract a falling edge of the second clock signal; and a phase discriminator, configured to compare a phase of the rising edge of the first clock signal with a phase of the falling edge of the second clock signal to generate the clock output signal.

Duty cycle adjustment apparatus

The present disclosure provides an error compensation correction system and method for an analog-to-digital converter with a time interleaving structure, the system includes an analog-to-digital converter with a time interleaving structure, a master clock module, a packet clock module, an error correction module, an adaptive processing module and an overall MUX circuit. Through the error compensation correction system and method for the analog-to-digital converter with a time interleaving structure according to the present disclosure, lower correction hardware implementation complexity and higher stability are ensured. The system and method according to the present disclosure are particularly suitable for interchannel mismatch error correction of dense channel time interleaving ADC, and the performance of the time interleaving ADC is improved.

Error compensation correction system and method for analog-to-digital converter with time interleaving structure

A high-linearity CMOS input buffer circuit is provided for neutralizing non-linearity of follower circuits' transconductance and output impedance resulting from input signals' variation. In doing so, the linearity of CMOS input buffer is improved. The buffer circuit includes a CMOS input follower circuit, a linearity improvement circuit of follower transistor, a current source load, and a linearity improvement circuit of load impedance. The buffer circuit is fabricated in standard CMOS process, featuring low cost, simplicity and strong linearity at high frequency. It has wide applications in analog and hybrid analog-digital CMOS ICs requiring high linearity input buffer.

CMOS input buffer circuit

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Chongqing, China

Liang Li