Changxin Memory Technologies, Inc.

Chinese Academy of Sciences

Hefei University of Technology

Anhui Ronds Science & Technology Incorporated Company

Liang Chen

Kai Tian

Hongwen Li

Jixing Chen

Yuxia Wang

Wei Jiang

Changhao Quan

Yu Zhang

Yingdong Guo

Zhiyuan Lu

Gang Liu

Qiang Li

Ning Yan

Liping Chai

Xiangyu Zhang

Dehong Chen

Hao Yan

Haixia Shi

Guosheng Xu

Weiyin Jia

Xuemeng Lan

Xiaozhen Su

Xianjun Yin

Yangyang Yin

Xingquan Wu

Bohong Chen

Minyou Ye

Mengfan Li

A chip testing method includes: a data receiving window corresponding to each chip to be tested is determined; a time adjustment parameter corresponding to each chip to be tested is determined according to the data receiving window corresponding to each chip to be tested and a data input window preset for a test machine is determined; an actual input time point corresponding to each chip to be tested is determined according to the time adjustment parameter corresponding to each chip to be tested; and data is inputted to each chip to be tested at the actual input time point corresponding to the each chip to be tested, to enable each chip to be tested to receive the data inputted by the test machine in the data receiving window corresponding to the each chip to be tested.

Chip testing method and apparatus

A refresh control circuit includes the following: an address output circuit configured to output a to-be-refreshed address signal including a block address signal and a row address signal; a block decoding circuit configured to: receive the block address signal; decode the block address signal and output a first block selection signal for selecting multiple data blocks from the memory array, in response to that the memory array is subjected to no row hammer attack, or decode the block address signal and output a second block selection signal for selecting one data block from the memory array, in response to that the memory array is subjected to a row hammer attack; and a row decoding circuit, configured to receive the row address signal, decode the row address signal and output a row selection signal.

Refresh control circuit and method, and memory

An adjustment method for the chip output characteristics can include the following steps. When adjusting the output characteristics of the chip to be tested, first it is determined whether the output characteristics of the chip to be tested have been adjusted according to the state of each E-fuse. When determining that the output characteristics of the chip to be tested have not been adjusted, the target adjustment solution corresponding to the chip is determined among a plurality of adjustment solutions in a targeted manner according to the output performance of the chip to be tested. The E-fuse in the chip to be tested is subjected to blowing treatment according to the target adjustment solution, so as to adjust the output characteristics of the chip to be tested.

Adjustment method and device for chip output characteristics

Embodiments of the present application provide a time offset method and device for a test signal. When a signal source sends a test signal to a DUT on a test platform, the offset device can determine a time delay caused by impedance matching of the test signal to the DUT at the upper side of each test location, and conduct time offset for TCK signals sent by the signal source to different DUTs according to the time delay.

Time offset method and device for test signal

The present disclosure provides a stellarator magnet based on cubic permanent magnet blocks and an arrangement optimization method thereof. For the characteristic that a three-dimensional magnet coil of a stellarator is complex in structure, the present disclosure provides the stellarator magnet based on the cubic permanent magnet blocks with uniform magnetization, same magnetization and same size; the magnetization directions of the cubic permanent magnet blocks are defined in a limited number of fixed alternative directions; the magnetic field configuration of the stellarator is generated by dipole magnetic fields provided by the permanent magnet blocks and planar coils, so that the device complexity of the stellarator is reduced, and the difficulty and cost of the machining and installation of the magnet are reduced. The shape of the permanent magnet blocks can be replaced by other regular shapes, and the permanent magnet is still formed by the permanent magnet blocks with same shape, same size, uniform magnetization and same magnetization. For the magnet, the present disclosure provides a magnet arrangement optimization method of 'local compensation' and related optimization strategies of 'threshold truncation,' &#x2018;global fine tuning,&#x2019; etc., for meeting different optimization requirements on accuracy of the magnetic fields, usage qualities of magnets, etc., and a magnetic field meeting designing requirements can be obtained.

Stellarator magnet based on cubic permanent magnet blocks and arrangement optimization method thereof

A method for designing an impeller with a small hub-tip ratio includes the following steps: S1: obtaining an outer diameter D of the impeller with the small hub-tip ratio; S2: determining the number of blades and an airfoil of the blade of the impeller with the small hub-tip ratio; S3: obtaining a blade solidity sat a rim of the impeller with the small hub-tip ratio and a blade solidity sat a hub of the impeller with the small hub-tip ratio; S4: dividing the blades of the impeller with the small hub-tip ratio into m cylindrical sections in an equidistant manner, marking the cylindrical sections as 1-1, 2-2, . . . , m-m in sequence from the hub to the rim, and obtaining an airfoil setting angle &#x3b2;of each of the cylindrical sections; and S5: performing a correction on the value of the airfoil setting angle &#x3b2;in S4.

Method for designing an impeller with a small hub-tip ratio and a rim-driven pump obtained by the method

The invention discloses a method, an apparatus, and a monitoring system for acquisition of a machine's rotating speed and vibration data. A machine rotating speed acquisition apparatus according to the inventive disclosure comprises a speed sensor and a controlling unit. The speed sensor is operative to count the pulses triggered during the rotation of the machine so as to acquire the machine's rotating speed. The controlling unit is operative to record the triggering moment of each pulse. Furthermore, each time when a pulse triggering moment is recorded, a rotating speed time scale message containing that pulse triggering moment is broadcasted to at least one machine vibration data acquisition apparatus, in order for the at least one machine vibration data acquisition apparatus to receive that rotating speed time scale message and record the local time when receiving that message.

Method, apparatus and monitoring system for acquisition of rotating speed and vibration data of machines

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Hefei, China

Liang Chen