Siemens Aktiengesellschaft

Liam Pettigrew

Henning Ochsenfeld

Thorsten Reimann

Athina Liatsa

Thomas Mittermeier

The invention relates to a method for monitoring a milling process of a printed circuit board, having the steps of: (a) detecting (S) the rotational speed of a milling head () of a milling machine () and at least one other operating parameter of the milling machine () during the milling process, wherein the other operating parameter is an electric supply current for operating the milling machine, and (b) analyzing (S) the detected rotational speed and the detected operating parameter using a trained adaptive algorithm for detecting anomalies during the milling process.

Method and device for monitoring a milling process

The disclosure relates to a method and a device for producing a product and to a computer program product. The product is produced in at least one production step. A quality control check is optionally carried out after at least one of the production steps to determine a quality index of the product in question. To save on the quality control check, a quality indicator of the product in question is determined using production data. The production data are advantageously provided by sensors. The quality indicator of the product in question may be calculated using an adaptive algorithm. The adaptive algorithm may be taught and/or improved using quality indices of a quality control unit and the corresponding production data. The adaptive algorithm may be taught with the aid of a further computing unit, in particular in a cloud.

Growing community of inventors

Petersham, Australia

Liam Pettigrew