Average Co-Inventor Count = 4.87
ph-index = 1
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Tsinghua University (16 from 4,304 patents)
2. Nuctech Company Limited (15 from 529 patents)
3. Huawei Technologies Co., Limited (9 from 27,246 patents)
4. International Business Machines Corporation (3 from 164,197 patents)
5. Nokia Technologies Oy (3 from 5,684 patents)
6. Yangtze Memory Technologies Co., Ltd. (2 from 1,157 patents)
7. Chinese Academy of Agricultural Sciences (1 from 117 patents)
8. Chinese Academy of Medical Sciences (1 from 115 patents)
9. Beijing Friendship Hospital, Capital Medical University (1 from 10 patents)
10. Boe Technology Group Co., Ltd. (18,154 patents)
11. Beijing Xiaomi Mobile Software Co., Ltd. (2,964 patents)
12. Nokia Solutions and Networks Oy (2,212 patents)
13. The University of Western Ontario (158 patents)
14. Hmd Global Oy (61 patents)
15. Shanghai Imilab Technology Co., Ltd. (11 patents)
37 patents:
1. 12505548 - Unsupervised MR-CT synthesis method, device, equipment, and storage medium
2. 12497247 - System and method for positioning suspected article
3. 12493135 - Vehicle-mounted security inspection system
4. 12488575 - Method and system of verifying authenticity of declaration information, device and medium
5. 12464039 - Cloud platform selection method, apparatus, and device, and medium
6. 12458303 - Support frame for ct slip-ring bearing
7. 12449560 - Checking method and checking system based on millimeter wave security inspection device and server
8. 12445875 - Cell global identity CGI processing method and device
9. 12437397 - Imaging system and method for radiographic inspection
10. 12438834 - Service sharing method and system, and electronic device
11. 12425893 - Mobility measurement method, apparatus, and communication device
12. 12417524 - Method and system of inspecting vehicle
13. 12404110 - Conveying device and inspection system
14. 12394751 - Method of forming semiconductor structure
15. 12352706 - Multi-channel radiographic inspection device