Western Digital (Fremont), Inc.

Li Zeng

Dehua Han

Zhigang Bai

Lisha Wang

Ming Sun

Yugang Wang

Jose Antonio Medina

Haifeng Wang

Lifan Chen

Liang Hong

Jia Li

The present disclosure provides for a magnetic writer pole for use in a hard drive. The magnetic writer pole comprises a first bevel formed by a non-magnetic layer, the first bevel formed at a first angle and extending to a first throat height. The magnetic writer pole further comprises a second bevel formed by the non-magnetic layer and extending distally from the first bevel at a second angle that is greater than the first angle and extending to a second throat height. The magnetic writer pole further comprises a third bevel formed by the non-magnetic layer and extending distally from the second bevel at a third angle that is greater than the second angle.

Gradient write gap for perpendicular magnetic recording writer

A method and system provide a magnetic transducer having an air-bearing surface (ABS) and an intermediate layer. A trench having a shape and location corresponding to a main pole is formed in the intermediate layer. The main pole is provided. At least a portion of the main pole is in the trench. Providing the main pole further includes vacuum depositing a first main pole material layer. The first main pole material layer is thin enough to preclude filling of the trench. The first main pole material layer is then ion beam etched. A second main pole layer is vacuum deposited on the first main pole layer. The second main pole material layer is also thin enough to preclude filling of the trench. An additional main pole layer is also deposited.

Method for fabricating a magnetic write pole using vacuum deposition

Methods for characterizing relative film density using spectroscopic analysis at the device level are provided. One such method includes obtaining a composition of materials at preselected areas of a workpiece using energy dispersive X-ray spectroscopy, obtaining an electron energy loss spectrum-imaging data at each of the preselected areas using electron energy loss spectroscopy, removing, for each of the preselected areas, a preselected noise component of the electron energy spectrum-imaging data to form a plasmon energy spectrum-imaging data, generating, for each of the preselected areas, a plasmon energy map based on the respective plasmon energy spectrum-imaging data, determining, for each of the preselected areas, an average plasmon energy value from the respective plasmon energy map, and calculating a relative mass density of the preselected areas based on the average plasmon energy value, a number of valence electrons per molecule, and a molecular weight for each of the preselected areas.

Methods for characterizing relative film density using spectroscopic analysis at the device level

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Fremont, CA, United States of America

Li Zeng