Vanguard International Semiconductor Corporation

Li-Wen Chuang

Yu-Chieh Chou

Yung-Fong Lin

Cheng-Tao Chou

Tsung-Hsiang Lin

Chun-Hsu Chen

Jui-Hung Yu

A high electron mobility transistor (HEMT) includes a semiconductor channel layer, a semiconductor barrier layer, a patterned semiconductor capping layer, and a patterned semiconductor protection layer disposed on a substrate in sequence. The HEMT further includes an interlayer dielectric layer and a gate electrode. The interlayer dielectric layer covers the patterned semiconductor capping layer and the patterned semiconductor protection layer, and includes a gate contact hole. The gate electrode is disposed in the gate contact hole and electrically coupled to the patterned semiconductor capping layer, where the patterned semiconductor protection layer is disposed between the gate electrode and the patterned semiconductor capping layer. The resistivity of the patterned semiconductor protection layer is between the resistivity of the patterned semiconductor capping layer and the resistivity of the interlayer dielectric layer.

High electron mobility transistor and fabrication method thereof

A semiconductor structure and a method for manufacturing the same are provided. The semiconductor structure includes a substrate and a seed layer on the substrate. The substrate includes a base and a composite layer encapsulating the base. The semiconductor structure also includes an epitaxial layer on the seed layer. The semiconductor structure also includes a semiconductor device on the epitaxial layer, and an interlayer dielectric layer on the epitaxial layer. The interlayer dielectric layer covers the semiconductor device. The semiconductor structure further includes a via structure that penetrates at least the composite layer of the substrate and is in contact with the base.

Semiconductor structure having a via and methods of manufacturing the same

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Taoyuan, Taiwan

Li-Wen Chuang