Alliance Fiber Optic Products, Inc.

Schlumberger Technologies, Inc.

Nptest, Inc.

Li Wang

Yuqiao Liu

Wei-Shin Tsay

Timothy Yuen-Lian Wang

Zhupei Shi

Christopher G Talbot

Chiwoei Wayne Lo

Weimin Liu

Sergey Etchin

Subramanian V Sankar

Jerry Lee

QiKiao Chen

Tim Wang

Yi-ping Loh

Bright An

Timothy Michael Montagne

Luis Camilo Orjuela

Improved designs of optical devices for processing optical signals with own or more specified wavelengths are disclosed. According to embodiment, a filter mirror assembly appears an 'L' shape and provides a filtering function as well as a reflecting function. The filter mirror assembly is so mounted that a rotation thereof will not alter the optical path the beam positions of signals resulted from the filter mirror assembly.

Tunable wavelength filter with invariant transmission and reflection beam angles

A fiber optical circulator includes a first collimator and a second collimator sandwiching a circulator core therebetween. The first collimator and the second collimator respectively define Portand Portthereof, and the first collimator further defines Portthereof. The circulator core includes a first crystal and a second crystal at two ends respectively confronting the first collimator and the second collimator aside. The circulator core further includes a first group of two half-wavelength waveplates and a first Faraday rotator, and second subassembly a second group of two half-wavelength waveplates and a second Faraday rotator. A third crystal is disposed between the first subassembly and the second subassembly wherein a backward light path from Portto Portpasses the third crystal and is deflected by the third crystal toward the first collimator though total internal reflection.

Fiber optical circulator

Techniques for bonding aligned optical parts to a substrate are disclosed. According to one embodiment, one or more wedges are used to fill in gaps between aligned optical parts and a substrate. Using an appropriate material, the wedges are respectively slid in till respective contacts between the aligned optical parts and the wedges are established, a small amount of a bonding agent is then only applied to the respect contacts. As a result, the shrinkage that may be caused by the bonding agent to destabilize the aligned optical parts is minimized and the alignments among the optical parts are preserved and can sustain under very high environmental stresses.

Method for bonding aligned optical parts and apparatus thereof

A method for bonding two or more optical parts and an optical apparatus of using the method are disclosed. According to one embodiment, two optical fiber segments are used as a spacer between two optical parts. The optical fiber segments may be cut off from a commonly used optical fiber according to the size of the parts. In general, the diameter of the optical fiber segments is small, the capillary effect for commonly used adhesives can be eliminated when the two optical parts are bonded with the optical fiber segments in between.

Method for bonding two optical parts and apparatus thereof

A scintillator assembly used in a FIB (Focused Ion Beam) system to detect secondary electrons achieves nearly 100 percent collection efficiency for the majority of useful secondary electron energy ranges. Further, the insulator in the assembly is placed such that it is completely out of the secondary electron path in order to avoid arcing which affects FIB secondary electron imaging. Also, the gap between the grounding cap and the scintillator allows high collection efficiency offered by earlier designs to be retained, and at the same time, improves the system reliability. Further, the scintillator assembly may be placed closer to the primary ion beam, which further improves collection efficiency.

Compact, high collection efficiency scintillator for secondary electron detection

The present invention, generally speaking, provides compact design of optical couplers for combining two differently polarized light beams onto a collimator or splitting a composed light beam into two differently polarized light beams. According to another embodiment, the size of the polarization beam combiner is minimized by using a pair of specially designed fiber collimators that use an asymmetrical sleeve. As a result, a coupler, according to the present invention, uses less components, is of small in size and provides an easy-aligning structure. Further the coupler offers lower optical insertion loss with minimized physical size.

Compact polarization couplers

Improved designs of fiber collimators that include an asymmetric sleeve are disclosed. According to one embodiment of the present invention, the asymmetric sleeve is so shaped that, when arranged next to each other, two collimators with the asymmetric sleeve achieves a lateral distance shorter than the outer diameter of the collimators, which makes it possible to design smaller optical components without effecting the performance and characteristics thereof.

Asymmetrical sleeve for fiber optical collimators and method therefor

The resolution of a charged particle beam, such as a focused ion beam (FIB), is optimized by providing an energy filter in the ion beam stream. The energy filter permits ions having a desired energy range to pass while dispersing and filtering out any ions outside the desired energy range. By reducing the energy spread of the ion beam, the chromatic aberration of the ion beam is reduced. Consequently, the current density of the ion beam is increased. The energy filter may be, e.g., a Wien type filter that is optimized as an energy filter as opposed to a mass filter. For example, to achieve useful dispersion the energy filter may use a quadrupole structure between two magnetic pole pieces thereby producing a combined quadrupole electric field and dipole electric field within a magnetic field.

Energy filtered focused ion beam column

A method for detecting electrical defects in a semiconductor wafer, includes the steps of: a) applying charge to the wafer such that electrically isolated structures are raised to a voltage relative to electrically grounded structures; b) obtaining voltage contrast data for at least a portion of the wafer containing such structures using an electron beam; and c) analyzing the voltage contrast data to detect structures at voltages different from predetermined voltages for such structures. Voltage contrast data can take one of a number of forms. In a simple form, data for a number of positions on a line scan of an electron beam can be taken and displayed or stored as a series of voltage levels and scan positions. Alternatively, the data from a series of scans can be displayed as a voltage contrast image. Analysis can be achieved by comparison of one set of voltage contrast data, for example voltage contrast data from one die on a wafer, with one or more other such sets, for example voltage contrast data for corresponding structures on one or more preceding dice, so as to determine differences therebetween.

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San Jose, CA, United States of America

Li Wang