Taiwan Semiconductor Manufacturing Comp. Ltd.

Li-Qun Sun

Mu-Jen Huang

Ya-Min Zhang

Ming Feng

Peng-Sheng Chen

A method of determining a device type and device properties includes receiving an input file including information related to a device, and identifying at least one layer set within the input file. The method further includes identifying at least one feature present in layer set. The method further includes analyzing a relationship between the at least one feature formed by the first layer and at least one feature formed by the second layer to determine at least one layer set relationship. The method further includes comparing the layer set relationship with at least one template layer set relationship. The method further includes determining the device type of the device based on the comparison between the layer set relationship and the template layer set relationship. The method further includes determining the device properties of the device based on the layer set relationship, the device type or the at least one feature.

Growing community of inventors

Shanghai, China

Li-Qun Sun