Hon Hai Precision Industry Co., Ltd.

Hong-Fu Jin Precision Industry (Shenzhen) Co., Ltd.

Foxconn Interconnect Technology Limited

Li-Jun Li

Fu-Jin Peng

Long Yu

Ju-Lan Hao

Zhan-Jun Xu

Fang-Quan Li

Yan-Bin Liu

Fu-Rong Feng

A tray used in a card connector for receiving a card therein includes a base having opposite top and bottom surfaces, a receiving room for receiving the card therein, and an inner surface surrounding the receiving room and connecting the top surface with the bottom surface. The base defines a plurality of thin portions projecting into the receiving room from the inner surface and a shallow notch recessed in the inner surface to adjacent to one of the plurality of thin portions, the shallow notch runs through both the top surface and the bottom surface. The present invention provides a low cost tray.

Tray with low cost used in a tray-type card connector

A testing tray includes a receiving member and a connector. The receiving includes a tray and a latching member. The tray includes a bottom wall, a peripheral sidewall protruded from the bottom wall, a resisting member and a guide groove. The resisting member includes a resisting portion and two elastic portions coupling the resisting portion with the peripheral sidewall. The tray includes at least one latching portion protruded from the peripheral sidewall. The latching member includes a sliding portion slidably mounted on the bottom wall to cover the guide groove and an elastic member located between the sliding portion and the bottom wall. The connector includes a fixed member detachably mounted on the at least one latching portion and a conducting member detachably mounted on the fixed member. The conducting member is capable of coupling the electronic device with a testing device.

Testing tray

Growing community of inventors

Shenzhen, China

Li-Jun Li