Princeton Technology Corporation

Li-Hung Chi

Mine-Yuan Huang

Hisn-Kuang Chen

An electrostatic discharge (ESD) protection circuit with electrical overstress (EOS) and latch-up immunity has a main ESD circuit, a voltage detection circuit and an electrostatic driving circuit. The main ESD circuit is coupled between a first rail and a second rail and has a control end. The main ESD circuit is configured to establish an electrical connection between the first rail and the second rail based on a voltage of the control end. The voltage detection circuit is coupled between the first rail and the second rail for setting the voltage of the control end when a voltage of the first rail is greater than a limiting voltage. The electrostatic driving circuit is used to drive the main ESD circuit when an ESD phenomenon occurs.

Electrostatic discharge (ESD) protection circuit with EOS and latch-up immunity

A method for arranging electronic elements is provided. The method is suitable for a set of N electronic elements in which N is an odd number. The set of N electronic elements include a first electronic element subset and a second electronic element subset. The electronic elements of the first electronic element subset are arranged according a first predetermined method and the electronic elements of the second electronic element subset are arranged according to a second predetermined method, wherein the second electronic element subset is adjacent to the first electronic element subset.

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Taipei, Taiwan

Li-Hung Chi